Infrared ellipsometry characterization of porous silicon Bragg reflectors

Applied Optics

Volumn 40, Issue 6, 2001, Pages 906-912

  Zangooie, Shahin ^a   Schubert, Mathias ^a,b   Trimble, Chris ^a   Thompson, Daniel W ^a   Woollam, John A ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ELLIPSOMETRY; INFRARED SPECTROSCOPY; POROUS MATERIALS; POROUS SILICON;

INFRARED ELLIPSOMETRY;

MIRRORS;

EID: 0038502532     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.000906     Document Type: Article

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