Extension of rotating-analyzer ellipsometry to generalized ellipsometry: Determination of the dielectric function tensor from uniaxial TiO2

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 13, Issue 4, 1996, Pages 875-883

  Schubert, Mathias ^a   Rheinländer, Bernd ^a   Woollam, John A ^b   Johs, Blaine ^c   Herzinger, Craig M ^c  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^c J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001521522     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.13.000875     Document Type: Article

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