Ellipsometry on anisotropic materials: Bragg conditions and phonons in dielectric helical thin films

Physica Status Solidi (A) Applied Research

Volumn 188, Issue 4, 2001, Pages 1563-1575

  Schubert, M ^a,b   Herzinger, C M ^c  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^c J A WOOLLAM CO INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000951955     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200112)188:4<1563::AID-PSSA1563>3.0.CO;2-8     Document Type: Article

References (11)

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