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Thin Solid Films

Volumn 313-314, Issue , 1998, Pages 323-332

Generalized ellipsometry and complex optical systems

(1) Schubert, M a,b

a UNIVERSITY OF LEIPZIG (Germany)

b UNIVERSITY OF NEBRASKA LINCOLN (United States)

Author keywords

Anisotropy; Generalized ellipsometry; Liquid crystals; Magneto optics; Optical Jones matrix; Polycrystalline media; Refractive indices

Indexed keywords

ALGORITHMS; ANISOTROPY; LIGHT REFLECTION; LIQUID CRYSTALS; MAGNETOOPTICAL EFFECTS; MATRIX ALGEBRA; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX;

COMPLEX OPTICAL SYSTEMS;

ELLIPSOMETRY;

EID: 0031999915 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(97)00841-9 Document Type: Article

Times cited : (130)

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