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Volumn 313-314, Issue , 1998, Pages 692-696
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Optical investigations of mixed-phase boron nitride thin films by infrared spectroscopic ellipsometry
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Author keywords
Anisotropy; Effective medium theory; Infrared ellipsometry; Mixed phase thin films
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Indexed keywords
CRYSTAL ATOMIC STRUCTURE;
CRYSTAL MICROSTRUCTURE;
CUBIC BORON NITRIDE;
ELLIPSOMETRY;
INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
PHASE COMPOSITION;
POLYCRYSTALLINE MATERIALS;
SPUTTER DEPOSITION;
EFFECTIVE MEDIUM THEORY;
INFRARED ELLIPSOMETRY;
MIXED PHASE THIN FILMS;
THIN FILMS;
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EID: 0031998637
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(97)00979-6 Document Type: Article |
Times cited : (9)
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References (14)
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