FTIR ellipsometry as a tool for studying organic layers: From langmuir-blodgett films to can coatings

Physica Status Solidi (A) Applied Research

Volumn 188, Issue 4, 2001, Pages 1319-1329

  Tsankov, D ^a   Hinrichs, K ^a   Roseler A ^a   Korte, E H ^a  

^a Department Berlin   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000765693     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200112)188:4<1319::AID-PSSA1319>3.0.CO;2-V     Document Type: Article

References (19)

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