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Volumn 455-456, Issue , 2004, Pages 619-623

Generalized ellipsometry for orthorhombic, absorbing materials: Dielectric functions, phonon modes and band-to-band transitions of Sb2S 3

Author keywords

Anisotropy; Band to band transitions; Dielectric functions; Generalized ellipsometry; Phonon modes; Stibnite

Indexed keywords

ABSORPTION; ANISOTROPY; BAND STRUCTURE; CURVE FITTING; DIELECTRIC PROPERTIES; ELECTRON TRANSITIONS; ELLIPSOMETRY; INFRARED RADIATION; LATTICE VIBRATIONS; LEAST SQUARES APPROXIMATIONS; PHONONS; REFRACTIVE INDEX; SINGLE CRYSTALS; ULTRAVIOLET RADIATION;

EID: 17144453334     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.207     Document Type: Conference Paper
Times cited : (36)

References (14)
  • 3
    • 84894003162 scopus 로고    scopus 로고
    • Theory and application of generalized ellipsometry
    • G.E. Irene, & H.W. Tompkins. Noyes Publications
    • Schubert M. Theory and application of generalized ellipsometry. Irene G.E., Tompkins H.W. Handbook of Ellipsometry. 2004;Noyes Publications.
    • (2004) Handbook of Ellipsometry
    • Schubert, M.1
  • 6
    • 0003554309 scopus 로고
    • Semiconductors other than group IV and III-V compounds
    • Springer, Berlin. This source uses the (historical) Pbnm assignment instead of Pnma
    • Semiconductors other than group IV and III-V compounds, in: R. Poerschke, O. Madelung, (Eds.), Data Science and Technology, Springer, Berlin, 1992. This source uses the (historical) Pbnm assignment instead of Pnma.
    • (1992) Data Science and Technology
    • Poerschke, R.1    Madelung, O.2
  • 13
    • 2142643703 scopus 로고    scopus 로고
    • Data analysis for spectroscopic ellipsometry
    • G.E. Irene, & H.W. Tompkins. Noyes Publications
    • Jellison G.E. Jr. Data analysis for spectroscopic ellipsometry. Irene G.E., Tompkins H.W. Handbook of Ellipsometry. 2004;Noyes Publications.
    • (2004) Handbook of Ellipsometry
    • Jellison Jr., G.E.1
  • 14
    • 2142768814 scopus 로고    scopus 로고
    • Infrared ellipsometry on semiconductor layer structures: Phonons, plasmons and polaritons
    • Springer, Heidelberg, in preparation
    • M. Schubert, Infrared ellipsometry on semiconductor layer structures: phonons, plasmons and polaritons, Series Springer Tracts in Modern Physics, Springer, Heidelberg, 2004, in preparation.
    • (2004) Series Springer Tracts in Modern Physics
    • Schubert, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.