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Volumn 216, Issue 1, 1999, Pages 655-658

Free-carrier response and lattice modes of group III-nitride heterostructures measured by infrared ellipsometry

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EID: 0033243017     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199911)216:1<655::AID-PSSB655>3.0.CO;2-8     Document Type: Article
Times cited : (10)

References (18)
  • 11
    • 0001118048 scopus 로고    scopus 로고
    • M. SCHUBERT, Phys. Rev. B 53, 4265 (1996): Thin Solid Films 313/314, 323 (1998), and references therein.
    • (1996) Phys. Rev. B , vol.53 , pp. 4265
    • Schubert, M.1
  • 12
    • 0031999915 scopus 로고    scopus 로고
    • and references therein
    • M. SCHUBERT, Phys. Rev. B 53, 4265 (1996): Thin Solid Films 313/314, 323 (1998), and references therein.
    • (1998) Thin Solid Films , vol.313-314 , pp. 323
  • 13
    • 0031998601 scopus 로고    scopus 로고
    • and references therein
    • G. E. JELLISON, Thin Solid Films 313/314, 33 (1998), and references therein.
    • (1998) Thin Solid Films , vol.313-314 , pp. 33
    • Jellison, G.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.