Infrared spectroscopy of LiF on Ag and Si

Physica Status Solidi (B) Basic Research

Volumn 215, Issue 1, 1999, Pages 155-159

  Humlicek J ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033197169     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199909)215:1<155::AID-PSSB155>3.0.CO;2-O     Document Type: Article

References (9)

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2. CH. KITTEL, Introduction to Solid State Physics, Chap. 10, Wiley, New York 1976.
3. A. ROESELER, Infrared Spectroscopic Ellipsometry, Chap. 1.4, Akademie-Verlag, Berlin 1990.
4. J. HUMLÍČEK, Thin Solid Films 313/314, 687 (1998).
5. S. ZOLLNER, J. P. CARREJO, T. E. TIWALD, and J. A. WOOLLAM, phys. stat. sol. (b) 208, R3 (1998).
6. E. D. PALIK (Ed.), Handbook of Optical Constants of Solids, Academic Press, Orlando (Fl), 1985.
7. J. HUMLÍČEK, Ferroelectrics 176, 221 (1996).
8. P. H. BERNING, in: Physics of Thin Films, Vol. 1, Ed. G. HAAS, Academic Press, New York 1963.
9. H. EHRENREICH, in: The Optical Properties of Solids, Ed. J. TAUC, Academic Press, New York 1966.