Band-gap energies, free carrier effects, and phonon modes in strained GaNAs/GaAs and GaNAs/InAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry

Journal of Applied Physics

Volumn 89, Issue 1, 2001, Pages 294-305

  Sik J ^a   Schubert, M ^a   Leibiger, G ^b   Gottschalch, V ^b   Wagner, G ^c  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

^b UNIVERSITY OF LEIPZIG   (Germany)

^c Inst Oberflachenmodifizierung L   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007112940     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1328778     Document Type: Article

References (73)

1. M. Kondow, K. Uomi, T. Kitatani, S. Watahiki, and Y. Yazawa, J. Cryst. Growth 164, 175 (1996).
2. M. C. Larson, M. Kondow, T. Kitatani, K. Nakahara, K. Tamura, H. Inoue, and K. Uomi, IEEE Photonics Technol. Lett. 10, 188 (1998).
3. M. Kondow, K. Uomi, A. Niwa, T. Kitatani, S. Watahiki, and Y. Yazawa, Jpn. J. Appl. Phys., Part 1 35, 1273 (1996).
4. S. Sato and S. Satoh, J. Cryst. Growth 192, 381 (1998).
5. K. Nakahara, M. Kondow, T. Kitatani, M. C. Larson, and K. Uomi, IEEE Photonics Technol. Lett. 10, 487 (1998).
6. C. Elmers, F. Höhnsdorf, J. Koch, C. Agert, S. Leu, D. Karajskaj, M. Hofmann, W. Stolz, and W. W. Rühle, Appl. Phys. Lett. 74, 2271 (1999).
7. D. E. Mars, D. I. Babic, Y. Kaneko, Y.-L. Chang, S. Subramanya, J. Kruger, P. Perlin, and E. R. Weber, J. Vac. Sci. Technol. B 17, 1272 (1999).
8. S.-H. Wei and A. Zunger, Phys. Rev. Lett. 76, 664 (1996).
9. J. Neugebauer and C. G. Van de Walle, Phys. Rev. B 51, 10568 (1995).
10. S. Sukai, Y. Ueta, and Y. Terauchi, Jpn. J. Appl. Phys., Part 1 32, 4413 (1993).
11. L. Bellaiche, S.-H. Wei, and A. Zunger, Phys. Rev. B 54, 17568 (1996).
12. M. Weyers and M. Sato, Appl. Phys. Lett. 62, 1396 (1994).
13. M. Sato, J. Cryst. Growth 145, 99 (1994).
14. A. Ougazzaden, Y. Le Bellego, E. V. K. Rao, M. Juhel, L. Leprince, and G. Patriache, Appl. Phys. Lett. 70, 2861 (1997).
15. Y. Qiu, S. A. Nikishin, H. Temkin, N. N. Faleev, and Yu. A. Kudriavtsev, Appl. Phys. Lett. 70, 3242 (1997).
16. E. V. K. Rao, A. Ougazzaden, Y. Le Bellego, and M. Juhel, Appl. Phys. Lett. 72, 1409 (1998).
17. C. Jin, Y. Qiu, S. A. Nikishin, and H. Temkin, Appl. Phys. Lett. 74, 3516 (1999).
18. W. G. Bi and C. W. Tu, Appl. Phys. Lett. 70, 1608 (1997).
19. S. Francoeur, G. Sivaraman, Y. Qiu, S. Nikishin, and H. Temkin, Appl. Phys. Lett. 72, 1857 (1998).
20. K. Uesugi and I. Suemune, Jpn. J. Appl. Phys., Part 2 36, L1572 (1997).
21. K. Onabe, D. Aoki, J. Wu, H. Yaguchi, and Y. Shiraki, Phys. Status Solidi A 176, 231 (1999).
22. I. A. Buyanova, W. M. Chen, G. Pozina, J. P. Bergman, B. Monemar, H. P. Xin, and C. W. Tu, Appl. Phys. Lett. 75, 501 (1999).
23. Y. Zhang, A. Mascarenhas, H. P. Xin, and C. W. Tu, Phys. Rev. B 61, 4433 (2000).
24. J. Šik, M. Schubert, G. Leibiger, V. Gottschalch, G. Kirpal, and J. Humlíček, Appl. Phys. Lett. 76, 2859 (2000).
25. T. Kitatani, M. Kondow, K. Shinoda, Y. Yazawa, and M. Okai, Jpn. J. Appl. Phys., Part 1 37, 753 (1998).
26. A. M. Mintairov, B. A. Blagnov, V. G. Melehin, N. N. Faleev, J. L. Merz, Y. Qiu, S. A. Nikishin, and H. Temkin, Phys. Rev. B 56, 15836 (1997).
27. T. Prokofyeva, T. Sauncy, M. Seon, M. Holtz, Y. Qiu, S. Nikishin, and H. Temkin, Appl. Phys. Lett. 73, 1409 (1998).
28. J. Šik, M. Schubert, T. Hofmann, G. Leibiger, and V. Gottschalch, MRS Internet J. Nitride Semicond. Res. 5, 3 (2000).
29. E. D. Palik, Handbook of Optical Constants of Solids (Academic, New York, 1998), Vol. I, p. 429.
30. M. Schubert, A. Kasic, T. E. Tiwald, J. A. Woollam, V. Härle, and F. Scholz, MRS Internet J. Nitride Semicond. Res. 5S1, 11 (2000).
31. M. Schubert, A. Kasic, T. E. Tiwald, J. Off, B. Kuhn, and F. Scholz, MRS Internet J. Nitride Semicond. Res. 4, 11 (1999).
32. M. Schubert, J. A. Woollam, A. Kasic, B. Rheinländer, J. Off, B. Kuhn, and F. Scholz, Phys. Status Solidi B 216, 655 (1999).
33. A. Kasic, M. Schubert, T. E. Tiwald, J. A. Woollam, S. Einfeldt, and D. Hommel, Phys. Rev. B 62, 7365 (2000).
34. E. D. Palik and R. T. Holm, Handbook of Optical Constants of Solids (Academic, New York, 1998), Vol. I, p. 479.
35. J. W. Orton and C. T. Foxon, Rep. Prog. Phys. 61, 1 (1998).
36. D. W. Thompson, M. J. DeVries, T. E. Tiwald, and J. A. Woollam, Thin Solid Films 313-314, 341 (1998).
37. Guide to Using WVASE32 (Woollam, Lincoln, 1995).
38. R. W. Collins, D. E. Aspnes, and E. A. Irene, Spectroscopic Ellipsometry (Elsevier, Lausanne, 1998).
39. G. E. Jellison, Thin Solid Films 313-314, 33 (1998), and references therein.
40. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1984).
41. D. E. Aspnes and A. A. Studna, Phys. Rev. B 27, 985 (1983).
42. D. E. Aspnes, Handbook of Optical Constants of Solids, edited by E. D. Palik (Academic, New York, 1998), Vol. I, p. 89.
43. A. Röseler, Infrared Spectroscopic Ellipsometry (Akademie, Berlin, 1990).
44. C. M. Herzinger, P. G. Snyder, B. Johs, and J. A. Woollam, J. Appl. Phys. 77, 1715 (1995).
45. S. Zollner, Appl. Phys. Lett. 63, 2523 (1993).
46. C. M. Herzinger, H. Yao, P. G. Snyder, F. G. Celii, Y.-C. Kao, B. Johs, and J. A. Woollam, J. Appl. Phys. 77, 4677 (1995).
47. C. C. Kim, J. W. Garland, H. Abad, and P. M. Raccah, Phys. Rev. B 45, 11749 (1992).
48. C. C. Kim, J. W. Garland, and P. M. Raccah, Phys. Rev. B 47, 1876 (1993).
49. J. W. Garland, C. C. Kim, H. Abad, and P. M. Raccah, Phys. Rev. B 41, 7602 (1990).
50. S. Adachi, Physical Properties of III-V Semiconductor Compounds (Wiley, New York, 1992).
51. M. Schubert, J. A. Woollam, G. Leibiger, B. Rheinländer, I. Pietzonka, T. Sass, and V. Gottschalch, J. Appl. Phys. 86, 2025 (1999).
52. C. M. Wolfe, N. Holonyak, and G. E. Stillmann, Physical Properties of Semiconductors (Prentice Hall, Englewood Cliffs, NJ, 1989).
53. P. Y. Yu and M. Cardona, Fundamentals of Semiconductors (Springer, Berlin, 1996).
54. R. P. Lowndes, Phys. Rev. B 1, 2754 (1970).
55. F. Gervais and B. Piriou, J. Phys. C 7, 2374 (1974).
56. D. W. Berreman and F. C. Unterwald, Phys. Rev. 174, 791 (1968).
57. M. Schubert, T. E. Tiwald, and C. M. Herzinger, Phys. Rev. B 61, 8187 (2000).
58. A. A. Kukharskii, Solid State Commun. 13, 1761 (1973).
59. D. W. Berreman, Phys. Rev. 130, 2193 (1963).
60. J. Humlíček, Phys. Status Solidi B 215, 155 (1999).
61. St. Zollner, J. P. Carrejo, T. E. Tiwald, and J. A. Woollam, Phys. Status Solidi B 208, R3 (1998).
62. Surface Polaritons, edited by V. M. Agranovich and D. L. Mills (North-Holland, Amsterdam, 1982), p. 10.
63. M. Schubert, T. Hofmann, T. E. Tiwald, and J. Sik (unpublished).
64. M. Schubert, B. Rheinländer, E. Franke, H. Neumann, T. E. Tiwald, J. A. Woollam, J. Hahn, and F. Richter, Phys. Rev. B 56, 13306 (1997).
65. R. C. Iotti, L. C. Andreani, and M. D. Ventra, Phys. Rev. B 57, R15072 (1998).
66. A. R. Goni, M. Stroh, C. Thomsen, F. Heinrichsdorff, V. Türck, A. Krost, and D. Bimberg, Appl. Phys. Lett. 72, 1433 (1998).
67. H. Schmidt, B. Rheinländer, and V. Gottschalch, Appl. Phys. Lett. 70, 1736 (1997).
68. K. A. Mader and A. Baldereschi, Optics of Excitons in Confined Systems, edited by A. D'Andrea et al. (IOP, Bristol, 1992).
69. L. Bellaiche, S.-H. Wei, and A. Zunger, Phys. Rev. B 56, 10233 (1997).
70. A. Lindsay and E. P. O'Reilly, Solid State Commun. 112, 443 (1999).
71. S.-H. Wei and A. Zunger, Phys. Rev. B 49, 14337 (1994).
72. Y. Zhang, A. Mascarenhas, H. P. Xin, and C. W. Tu, Phys. Rev. B 61, 7479 (2000).
73. C. Skierbiszewski, P. Perlin, P. Wisniewski, W. Knap, T. Suski, W. Walukiewicz, W. Shan, K. M. Yu, J. W. Ager, E. E. Haller, J. F. Geisz, and J. M. Olson, Appl. Phys. Lett. 76, 2409 (2000).