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Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 23, 2011, Pages

Charge transition levels of carbon-, oxygen-, and hydrogen-related defects at the SiC/SiO 2 interface through hybrid functionals

(4) Devynck, Fabien a Alkauskas, Audrius a Broqvist, Peter a Pasquarello, Alfredo a

a EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84855408864 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.84.235320 Document Type: Article

Times cited : (101)

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