|
|
Volumn 505, Issue , 2002, Pages 358-366
|
|
Oxidation studies of 4H-SiC(0 0 0 1) and (0 0 0 ī)
|
|
Author keywords
Oxidation; Photoemission (total yield); Silicon carbide; Silicon oxides
|
|
Indexed keywords
CRYSTALLINE MATERIALS;
ELECTRON ENERGY LEVELS;
OXIDATION;
PHOTOEMISSION;
SPECTRUM ANALYSIS;
OXIDATION STATES;
SILICON CARBIDE;
|
|
EID: 0036569545
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(02)01154-8 Document Type: Article |
|
Times cited : (65)
|
|
References (19)
|
