Assessing the accuracy of hybrid functionals in the determination of defect levels: Application to the As antisite in GaAs

Physical Review B - Condensed Matter and Materials Physics

Volumn 84, Issue 7, 2011, Pages

  Komsa, Hannu Pekka ^a   Pasquarello, Alfredo ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80052435564     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.075207     Document Type: Article

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