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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 19, 2011, Pages

Defect levels of carbon-related defects at the SiC/SiO2 interface from hybrid functionals

(4) Devynck, Fabien a Alkauskas, Audrius a Broqvist, Peter a Pasquarello, Alfredo a

a EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961114574 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.195319 Document Type: Article

Times cited : (55)

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