Mechanism for the enhanced diffusion of charged oxygen ions in SiO2

Physical Review Letters

Volumn 86, Issue 9, 2001, Pages 1793-1796

  Jin, Young Gu ^a   Chang, K J ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; DIFFUSION; IONS; MOLECULAR STRUCTURE; OXIDATION; OXYGEN; SILICA;

CHARGED OXYGEN ION; ENHANCED DIFFUSION;

ELECTRONIC STRUCTURE;

EID: 14344272697     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.1793     Document Type: Article

References (19)

1. C. J. Sofield and A. M. Stoneham, Semicond. Sci. Technol. 10, 215 (1995), and references therein.
2. J. R. Engstrom, D. J. Bonser, and T. Engel, Surf. Sci. 268, 238 (1992).
3. I. W. Boyd, V. Craciun, and A. Kazor, Jpn. J. Appl. Phys. 32, 6141 (1993).
4. J.-Y. Zhang and I. W. Boyd, Appl. Phys. Lett. 71, 2964 (1997).
5. D. R. Hamann, Phys. Rev. Lett. 81, 3447 (1998).
6. Y.-G. Jin, J.-W. Jeong, and K. J. Chang, Physica (Amsterdam) 273-274B, 1003 (1999).
7. J. P. Perdew, K. Burke, and M. Ernzerhof, Phys. Rev. Lett. 77, 3865 (1996).
8. J. R. Chelikowsky, N. Troullier, and Y Saad, Phys. Rev. Lett. 72, 1240 (1994).
9. K.-O. Ng and D. Vanderbilt, Phys. Rev. B 59, 10 132 (1999).
10. G. Pacchioni and G. Ieranò, Phys. Rev. B 56, 7304 (1997).
11. D. L. Griscom, J. Non-Cryst. Solids 73, 51 (1985).
12. D. R. Hamann, Phys. Rev. B 55, 14 784 (1997).
13. T. Uchino, Y Kitagawa, and T. Yoko, Phys. Rev. B 61, 234 (2000).
14. M. A. Lamkin, F. L. Riley, and R. J. Fordham, J. Eur. Ceram. Soc. 10, 347 (1992).
15. H. Kobayashi, T. Yuasa, K. Yamanaka, K. Yoneda, and Y. Todokoro, J. Chem. Phys. 109, 4997 (1998).
16. N. Cabrera and N. F. Mott, Rep. Prog. Phys. 12, 164 (1949).
17. 2-.
18. S. Kimura, E. Murakami, K. Miyake, T. Warabisako, H. Sunami, and T. Tokuyama, J. Electrochem. Soc. 132, 1460 (1985).
19. S. K. Sharma, B. C. Chakravarty, S. N. Singh, and B. K. Das, J. Mater. Sci. Lett. 9, 982 (1990).