Alignment of defect energy levels at Si-SiO2 interface from hybrid density functional calculations

AIP Conference Proceedings

Volumn 1199, Issue , 2009, Pages 79-80

  Alkauskas, Audrius ^a   Broqvist, Peter ^a   Pasquarello, Alfredo ^a  

^a NONE

Author keywords

Defects; Energy levels; Hybrid density functionals; Oxide

Indexed keywords

EID: 74849090154     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3295562     Document Type: Conference Paper

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