SiC/SiO2 interface-state generation by electron injection

Journal of Applied Physics

Volumn 85, Issue 12, 1999, Pages 8292-8298

  Afanas'ev, V V ^a   Stesmans, A ^a   Bassler, M ^b   Pensl, G ^b   Schulz, M J ^b   Harris, C I ^c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^c ACREO AB   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043210897     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370672     Document Type: Article

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