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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 24, 2000, Pages

Validity of the bond-energy picture for the energetics at Si-SiO2 interfaces

(2) Bongiorno, A a Pasquarello, A a

a EPFL (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON DERIVATIVE; SILICON DIOXIDE;

ARTICLE; CHEMICAL BINDING; ELECTRONICS; MOLECULAR INTERACTION; OXIDATION; SURFACE PROPERTY;

EID: 0034670809 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.R16326 Document Type: Article

Times cited : (69)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.