Si-O-Si bond-angle distribution in vitreous silica from first-principles NMR analysis

Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 8, 2000, Pages R4786-R4789

  Mauri, Francesco ^a   Pasquarello, Alfredo ^a   Pfrommer, Bernd G ^a   Yoon, Young Gui ^a   Louie, Steven G ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001767037     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.62.R4786     Document Type: Article

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