Energy levels of candidate defects at SiC/SiO2 interfaces

AIP Conference Proceedings

Volumn 1199, Issue , 2009, Pages 108-109

  Devynck, Fabien ^a   Alkauskas, Audrius ^a   Broqvist, Peter ^a   Pasquarello, Alfredo ^a  

^a NONE

Author keywords

Band gap; Defects; SiC SiO2 interface

Indexed keywords

EID: 74849095908     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3295319     Document Type: Conference Paper

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