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Volumn 106, Issue , 2009, Pages 113-168

Surface and Interface Chemistry for Gate Stacks on Silicon

Author keywords

Atomic Layer Deposition; Atomic Layer Deposition Cycle; Atomic Layer Deposition Growth; Gate Stack; Interface Chemistry

Indexed keywords


EID: 85072863737     PISSN: 0933033X     EISSN: 21962812     Source Type: Book Series    
DOI: 10.1007/978-3-540-74559-4_6     Document Type: Chapter
Times cited : (8)

References (207)
  • 6
    • 29744434208 scopus 로고    scopus 로고
    • A.A. Demkov, A. Navrotsky (eds.), Springer, Dordrecht
    • A.A. Demkov, A. Navrotsky (eds.), Materials Fundamentals of Gate Dielectrics (Springer, Dordrecht, 2005)
    • (2005) Materials Fundamentals of Gate Dielectrics
  • 9
    • 85072849720 scopus 로고    scopus 로고
    • D.C. Burkman, D. Deal, D.C. Grant, D.A. Peterson, in Handbook of Silicon Wafer Cleaning Technology: Science, Technology, and Applications, ed. by W. Kern (Noyes, Park Ridge, 1993)
    • Burkman, D.C.1    Deal, D.2    Grant, D.C.3    Peterson, D.A.4
  • 10
    • 85072863402 scopus 로고
    • Noyes, Park Ridge
    • W. Kern (ed.), Handbook of Semiconductor Wafer Cleaning Technology: Science, Technology, and Applications (Noyes, Park Ridge, 1993)
    • (1993) W. Kern
  • 43
    • 0003520079 scopus 로고
    • ed. by C.R. Helms, B.E. Deal (Plenum, New York
    • 2 Interface, ed. by C.R. Helms, B.E. Deal (Plenum, New York, 1988)
    • (1988) 2 Interface
    • Ourmazd, A.1    Bevk, J.2
  • 58
    • 85072851946 scopus 로고
    • American Institute of Physics, New York
    • M. Grundner, R. Schulz, in AIP Conf. Proc. No 167 (American Institute of Physics, New York, 1988)
    • (1988) AIP Conf. Proc. No , vol.167
    • Grundner, M.1    Schulz, R.2
  • 127
    • 85072869568 scopus 로고    scopus 로고
    • X. Zhang, Ph.D. Thesis, Rutgers University, New Brunswick, NJ, 2002
    • (2002)
    • Zhang, X.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.