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Volumn 54, Issue , 2003, Pages 29-56

In Search of Perfection: Understanding the Highly Defect-Selective Chemistry of Anisotropic Etching

Author keywords

Monte Carlo; Silicon; STM; Vibrational spectroscopy

Indexed keywords

COMPUTER SIMULATION; CORRELATION METHODS; CRYSTALLOGRAPHY; ETCHING; INFRARED SPECTROSCOPY; LITHOGRAPHY; MONTE CARLO METHODS; REACTION KINETICS; RESONATORS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE REACTIONS;

EID: 0043283162     PISSN: 0066426X     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev.physchem.54.011002.103849     Document Type: Article
Times cited : (93)

References (74)
  • 2
    • 0042055701 scopus 로고    scopus 로고
    • Deleted in proof
    • Deleted in proof
  • 42
    • 0003413619 scopus 로고
    • ed. JC Bailar Jr, HJ Emeléus, R Nyholm. Oxford: Pergamon
    • Rochow EG. 1973. In Comprehensive Inorganic Chemistry, ed. JC Bailar Jr, HJ Emeléus, R Nyholm, p. 123. Oxford: Pergamon
    • (1973) Comprehensive Inorganic Chemistry , pp. 123
    • Rochow, E.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.