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Volumn 54, Issue , 2003, Pages 29-56
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In Search of Perfection: Understanding the Highly Defect-Selective Chemistry of Anisotropic Etching
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Author keywords
Monte Carlo; Silicon; STM; Vibrational spectroscopy
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Indexed keywords
COMPUTER SIMULATION;
CORRELATION METHODS;
CRYSTALLOGRAPHY;
ETCHING;
INFRARED SPECTROSCOPY;
LITHOGRAPHY;
MONTE CARLO METHODS;
REACTION KINETICS;
RESONATORS;
SCANNING TUNNELING MICROSCOPY;
SILICON;
SURFACE REACTIONS;
ANISOTROPIC ETCHANTS;
ANISOTROPY;
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EID: 0043283162
PISSN: 0066426X
EISSN: None
Source Type: Book Series
DOI: 10.1146/annurev.physchem.54.011002.103849 Document Type: Article |
Times cited : (93)
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References (74)
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