Impact of organic contamination on the electrical properties of hydrogen-terminated silicon under ambient conditions

Applied Physics Letters

Volumn 81, Issue 26, 2002, Pages 4967-4969

  Liu, Yong Jun ^a   Waugh, Damien M ^a   Yu, Hua Zhong ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; CURRENT DENSITY; ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; HYDROGEN; INFRARED SPECTROSCOPY; ORGANIC SOLVENTS; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SURFACE PROPERTIES;

ORGANIC CONTAMINATION;

SEMICONDUCTING SILICON;

EID: 0037164803     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1532758     Document Type: Article

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