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Volumn 20, Issue 4, 2001, Pages 645-672

The picture tells the story: Using surface morphology to probe chemical etching reactions

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIUM FLUORIDE; HYDROGEN; SILICON DIOXIDE;

EID: 0035207112     PISSN: 0144235X     EISSN: None     Source Type: Journal    
DOI: 10.1080/01442350110071966     Document Type: Review
Times cited : (41)

References (52)
  • 29
    • 0006896481 scopus 로고    scopus 로고
    • PhD Dissertation, School of Applied and Engineering Physics, Cornell University, Ithaca, New York
    • (2000)
    • Huang, Y.-C.1
  • 37
    • 0006933992 scopus 로고    scopus 로고
    • PhD Dissertation, Department of Chemistry, Cornell University, Ithaca, New York
    • (2000)
    • Newton, T.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.