Local phenomena in oxides by advanced scanning probe microscopy

Journal of the American Ceramic Society

Volumn 88, Issue 5, 2005, Pages 1077-1098

  Kalinin, Sergei V ^a   Shao, Rui ^b,c   Bonnell, Dawn A ^b,d,e,f  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF PENNSYLVANIA   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

^d Nano/Bio Interface Center   (United States)

^e Basic Science Division   (United States)

^f AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NANOMETER SCALES; POLYCRYSTALLINE OXIDES; SCANNING PROBE MICROSCOPY (SPM); TRANSPORT PHENOMENA;

FERROELECTRIC MATERIALS; IMAGING TECHNIQUES; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; POLYCRYSTALLINE MATERIALS; TRANSPORT PROPERTIES;

CERAMIC MATERIALS;

EID: 27644453014     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00383.x     Document Type: Review

References (210)

1. 2 (110) Surface Determined by STM," Science (Washington, D.C.), 250, 1230-41 (1991).
2. D. A. Bonnell, "Scanning Tunneling Microscopy and Speclroscopy of Oxide Surfaces," Prop. Surf. Sci., 57, 187-252 (1998).
3. 3 at 1400°C in Air," J. Am. Ceram. Soc., 86, 1933-9 (2003).
4. V. R. Vedula, S. J. Glass, D. M. Saylor, G. S. Rohrer, W. C. Carter, and S. A. Langer, "Residual Stress Predictions in Polycrystalline Alumina," J. Am. Ceram. Soc., 84, 2947-54 (2001).
5. D. A. Bonnell and J. Kiely, "Local Plasticity at Metal Ceramic Interfaces," Phys. Slat. Sol. A, 166, 7-17 (1998).
6. 3(010) Surface During Reduction Reactions," J. Catalysis, 163, 12-7 (1996).
7. 3(010) Surface During the Partial Oxidation of Methanol," J. Catalysis, 180, 270-8 (1998).
8. As Determined from COMPENDEX for 2002.
9. D. A. Bonnell (ed.), Scanning Probe Microscopy and Spectroscopy: Theory, Techniques and Applications, 2nd edition, VCH, New York, 2000.
10. R. Wiesendanger (ed.), Scanning Probe Microscopy and Spectroscopy-Methods and Applications. Cambridge University Press, Cambridge, UK, 1994.
11. G. Friedbacher and H. Fuchs, "Classification of Scanning Probe Microscopies - (Technical Report)," Pure Appl. Chem.. 71, 1337-57 (1999).
12. L. Bottomley, "Scanning Probe Microscopy," Anal. Chem., 70, 425R-75R (1998) and the References Therein.
13. W. Hofer, A. Foster, and A. Shluger, "Theories of Scanning Probe Microscopes at the Atomic Scale," Rev. Mod. Phys., 75, 1287-331 (2003).
14. R. Garcia and R. Perez, "Dynamic Atomic Force Microscopy Methods," Surf. Sci. Rep., 47, 197-301 (2002).
15. G. Binnig, C. F. Quate, and Ch. Gerber, "Atomic Force Microscope," Phys. Rev. Lett., 56, 930 (1986).
16. C. Argento and R. H. French, "Parametric Tip Model and Force-Distance Relation for Hamaker Constant Determination from Atomic Force Microscopy," J. Appl. Phys., 80, 6081-90 (1996).
17. R. Bennewitz, A. S. Foster, L. N. Kantorovich, M. Bammerlin, Ch. Loppacher, S. Schar, M. Guggisberg, E. Meyer, and A. L. Shluger, "Atomieally Resolved Edges and Kinks of NaCl Islands on Cu(111): Experiment and Theory," Phys. Rev. B, 62, 2074-84 (2000).
18. A. S. Foster, A. L. Shluger, and R. M. Nieminem, "Realistic Model Tips in Simulations of nc-AFM," Nanotechnology, 15, S60-4 (2004).
19. B. Capella and G. Dietler, "Force-Distance Curves by Atomic Force Microscopy," Surf. Sci. Rep., 34, 1-104 (1999).
20. T. R. Albrecht, P. Grütter, and D. Rugar, "Frequency Modulation Detection Using High-Q Cantilevers for Enhanced Force Microscope Sensitivity," J. Appl. Phys., 69, 668-73 (1991).
21. In many cases, contact mode AFM provides "lattice imaging" when the periodicity of sample surface is clearly seen, but the contact between the tip and the surface occurs at multiple regions, precluding true atomic resolution when individual atomic defects can be observed.
22. F. J. Giessibl, "Atomic Resolution of the Silicon (111)-(7 × 7) Surface by Atomic Force Microscopy," Science, 267, 68-71 (1995).
23. Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, "Defect Motion on an InP(110) Surface Observed with Noncontact Atomic Force Microscopy," Science, 270, 1646-8 (1995).
24. S. Kitamura and M. Iwatsuki, "Observation of 7 × 7 Reconstructed Structure on the Silicon (111) Surface Using Ullrahigh Vacuum Noncontact Atomic Force Microscopy," Jpn. J. Appl. Phys., 35, L145-8 (1995).
25. 3(100)-(sqrt[5] × sqrt[5])-R26.6°," Phys. Rev. Lett., 86, 1801-4 (2001).
26. S. Orisaka, T. Minobe, T. Uchihashi, V. Sugawara, and S. Morita, "The Atomic Resolution Imaging of Metallic Ag(111) Surface by Noncontact Atomic Force Microscope," Appl. Surf. Sci., 140, 243-6 (1999).
27. C. Loppacher, M. Bammerlin, M. Guggisberg, S. Schar, A. Baraloff, E. Meyer, and H. J. Güntherodt, "Dynamic Force Microscopy of Copper Surfaces: Atomic Resolution and Distance Dependence of Tip-Sample Interaction and Tunneling Current," Phys. Rev. B, 62, 16944-9 (2000).
28. C. Loppacher, M. Bammerlin, M. Guggisberg, F. Barttison, R. Bennewitz, S. Rast, A. Baraloff, E. Meyer, and H. J. Güntherodt, "Phase Variation Experiments in Non-Contact Dynamic Force Microscopy Using Phase Locked Loop Techniques," Appl. Surf. Sci., 140, 287-92 (1999).
29. T. Minobe, T. Uchihashi, T. Tsukamoto, S. Orisaka, V. Sugawara, and S. Morita, "Distance Dependence of Noncontact-AFM Image Contrast on Si(1 11) x Ag Structure," Appl. Surf. Sci., 140, 298-303 (1999).
30. M. A. Lantz, H. J. Hug, P. J. A. van Schendel, R. Hoffmann, S. Martin, A. Baratoff, A. Abdurixit, and H.-J. Güntherodt, "Low Temperature Scanning Force Microscopy of the Si(111)-(7 × 7) Surface," Phys. Rev. Lett., 84, 2642-5 (2000).
31. W. Allers, A. Schwarz, U. Schwarz, and R. Wiesendanger, "Dynamic Scanning Force Microscopy at Low Temperatures on a Noble-Gas Crystal: Atomic Resolution on the Xenon(111) Surface," Europhys. Lett., 48, 276-9 (1999).
32. J. M. R. Weaver and D. W. Abraham, "High Resolution Atomic Force Microscopy Potentiometry," J. Vac. Sci. Technol., B9, 1559-61 (1991).
33. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, "Kelvin Probe Force Microscopy," Appl. Phys. Lett., 58, 2921-3 (1991).
34. A. K. Henning and T. Hochwitz, "Scanning Probe Microscopy for 2-D Semiconductor Dopant Profiling and Device Failure Analysis," Mater. Sci. Eng., B 42, 88-98 (1996).
35. H. O. Jacobs, P. Lcuchtmann, O. J. Homan, and A. Stemmer, "Resolution and Contrast in Kelvin Probe Force Microscopy," J. Appl. Phys., 84, 1168-73 (1998).
36. A. Efimov and S R. Cohen, "Simulation and Correction of Geometric Distortions in Scanning Kelvin Probe Microscopy," J. Vac. Sci. Technol. A, 18, 1051-5 (2000).
37. S. V. Kalinin and D. A. Bonnell, "Local Potential and Polarization Screening on Ferroelectric Surfaces," Phys. Rev. B, 63, 125411 (2001).
38. S. Cunningham, I. A. Larkin, and J. H. Davis, "Noneontact Scanning Probe Microscope Potentiometry of Surface Charge Patches: Origin and Interpretation of Time-Dependent Signals," Appl. Phys. Lett., 73, 123-5 (1998).
39. K. Franke, H. Huelz, and M. Weihnacht, "How to Extract Spontaneous Polarization Information from Experimental Data in Electric Force Microscopy," Surf. Sci., 415, 178-82 (1998).
40. 3(100) Surface," J. Appl. Phys., 91, 3816-23 (2002).
41. C. Donolato, "Electrostatic Tip-Sample Interaction in Immersion Force Microscopy of Semiconductors." Phys. Rev. B, 54, 1478-81 (1996).
42. Y. Leng, C. C. Williams, L. C. Su, and G. B. Stringfellow, "Atomic Ordering of GalnP Studied by Kelvin Probe Force Microscopy," Appl. Phys. Lett., 66, 1264-6 (1995).
43. M. Tanimoto and O. Vatel, "Kelvin Probe Force Microscopy for Characterization of Semiconductor Devices and Processes," J. Vac. Sci. Technol., B 14, 1547-51 (1996).
44. T. Hochwitz, A. K. Henning, C. Levey, C. Daghlian, J. Slinkman, J. Never, P. Kaszuba, R. Gluck, R. Wells, J. Pekarik, and R. Finch, "Imaging Integrated Circuit Dopant Profiles with the Force-Based Scanning Kelvin Probe Microscope," J. Vac. Sci. Teehnol., B 14, 440-6 (1996).
45. M. Fujihira, "Kelvin Probe Force Microscopy of Molecular Surfaces," Annu. Rev. Mater. Sci., 12, 353-80 (1999).
46. X. Q. Chen, H. Yamada, T. Horiuchi, K. Matsushige, S. Watanabe, M. Kawai, and P. S. Weiss, "Surface Potential of Ferroelectric Thin Films Investigated by Scanning Probe Microscopy," J. Vac. Sci. Technol., B 17, 1930-4 (1999).
47. T. Tybell, C. H. Ahn, and J.-M. Triscone, "Ferroelectricity in Thin Perovskite Films," Appl. Phys. Lett., 75, 856-8 (1999).
48. P. M. Bridger, Z. Z. Bandic, E. C. Piquette, and T. C. McGill, "Measurement of Induced Surface Charges, Contact Potentials, and Surface States in GaN by Electric Force Microscopy," Appl. Phys. Lett., 74, 3522-4 (1999).
49. Q. Xu and J. W. P. Hsu, "Electrostatic Force Microscopy Studies of Surface Defects on GaAs/Ge Films," J. Appl. Phys., 85, 2465-72 (1999).
50. A. Chavez-Pirson, O. Vatel, M. Tanimoto, H. Ando, H. Iwamura, and H. Kanbe, "Nanometer-Scale Imaging of Potential Profiles in Optically Excited n-i-p-i Heterostructure Using Kelvin Probe Force Microscopy," Appl. Phys. Lett., 67, 3069-71 (1995).
51. T. Meoded, R. Shikler, N. Fried, and Y. Rosenwaks, "Direct Measurement of Minority Carriers Diffusion Length Using Kelvin Probe Force Microscopy," Appl. Phys. Lett., 75, 2435-7 (1999).
52. 2 (100) Surface by Variable Temperature Scanning Surface Potential Microscopy," Z. Metallkd., 90, 983-9 (1999).
53. B. D. Huey, D. Lisjak, and D. A. Bonnell, "Nanometer-Scale Variations in Interface Potential by Scanning Probe Microscopy," J. Am. Ceram. Soc., 82 [7] 1941-4 (1999).
54. S. V. Kalinin and D. A. Bonnell, "Local Potential at Atomically Abrupt Oxide Grain Boundaries by Scanning Probe Microscopy;" Solid State Phen., 80-81, 33-44 (2001).
55. V. Meunier, Private Communications.
56. P. De Wolf, R. Stephenson, T. Trenkler, T. Clarysse, T. Hantschel, and W. Vandervorst, "Status and Review of Two-Dimensional Carrier and Dopant Profiling Using Scanning Probe Microscopy," J. Vac. Sci. Technol., B 18, 361-8 (2000).
57. P. De Wolf, J. Snauwaert, L. Hellemans, T. Clarysse, W. Vandervorst, M. D'Olieslaeger, and D. Quaeyhaegens, "Lateral and Vertical Dopant Profiling in Semiconductors by Atomic Force Microscopy Using Conducting Tips," J. Vac. Sci. Technol., A 13, 1699-704 (1995).
58. P. De Wolf, T. Clarysse, and W. Vandervorst, "Low Weight Spreading Resistance Profiling of Ultrashallow Dopant Profiles," J. Vac. Sci. Technol., B 16, 401-5 (1998).
59. J. R. Matey and J. Blanc, "Scanning Capacitance Microscopy," J. Appl. Phys., 57, 1437-44 (1985).
60. R. C. Barrett and C. F. Quate, "Charge Storage in a Nitride-Oxide-Silicon Medium by Scanning Capacitance Microscopy," J. Appl. Phys., 70, 2725-33 (1991).
61. Y. Huang, C. C. Williams, and M. A. Wendman, "Quantitative Two-Dimensional Dopant Profiling of Abrupt Dopant Profiles by Cross-Sectional Scanning Capacitance Microscopy." J. Vac. Sci. Technol., A 14, 1168-71 (1996).
62. T. Hantschel, P. Niedermann, T. Trenkler, and W. Vandervorst, "Highly Conductive Diamond Probes for Scanning Spreading Resistance Microscopy," Appl. Phys. Lett., 76, 1603-5 (2000).
63. J. T. Marchiando and J. J. Kopanski, "Regression Procedure for Determining the Dopant Profile in Semiconductors from Scanning Capacitance Microscopy Data," J. Appl. Phys., 92, 5798-809 (2002).
64. J. Yang and F. C. J. Kong, "Simulation of Interface States Effect on the Scanning Capacitance Microscopy Measurement of p-n Junctions," Appl. Phys. Lett., 81, 4973-5 (2002).
65. S. Lányi, J. Török, and P. Rehurek, "Imaging Conducting Surfaces and Dielectric Films by a Scanning Capacitance Microscope," J. Vac. Sci. Technol., B 14, 892-6 (1996).
66. S. Belaidi, P. Girard, and G. Leveque, "Electrostatic Forces Acting on the Tip in Atomic Force Microscopy: Modelization and Comparison with Analytic Expressions," J. Appl. Phys., 81, 1023-30 (1997).
67. J. R. Maedonald (ed.), Impedance Spectroscopy: Emphasising Solid Materials and Systems. Wiley, New York, 1987.
68. S. V. Kalinin and D. A. Bonnell, "Scanning Impedance Microscopy of Electroaclive Interfaces," Appl. Phys. Lett., 78, 1306-8 (2001).
69. 3 Ceramics," J. Am. Cer. Soc., 85, 3011-7 (2003).
70. M. A. Eriksson, R. G. Beck, M. Topinka, J. A. Katine, R. M. Westervelt, K. L. Campman, and A. C. Gossard, "Cryogenic Scanning Probe Characterization of Semiconductor Nanostructures," Appl. Phys. Lett., 69, 671-3 (1996).
71. S. J. Tans and C. Dekker, "Molecular Transistors: Potential Modulations Along Carbon Nanotubes," Nature, 404, 834-5 (2000).
72. S. V. Kalinin, D. A. Bonnell, M. Freitag, and A. T. Johnson, "Tip-Gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices," Appl. Phys. Lett., 81, 5219-21 (2002).
73. S. V. Kalinin and D. A. Bonnell, "Scanning Impedance Microscopy of an Active Schottky Barrier Diode," J. Appl. Phys., 95, 832-9 (2002).
74. R. Shao, S. V. Kalinin, and D. A. Bonnell, "Local Impedance Imaging and Spectroscopy of Polycrystalline ZnO Using Contact Atomic Force Microscopy," Appl. Phys. Lett., 82, 1869-71 (2003).
75. R. O'Hayre, M. H. Lee, and F. B. Prinz, "Ionic and Electronic Impedance Imaging Using Atomic Force Microscopy." J. Appl. Phys., 95, 8382-92 (2004).
76. R. O'Hayre, G. Feng, W. D. Nix, and F. B. Prinz, "Quantitative Impedance Measurement Using Atomic Force Microscopy," J. Appl. Phys., 96, 3540-9 (2004).
77. A. Gruverman, "Ferroelectric Nanodomains;" pp. 359-75 in Encyclopedia of Nanoscience and Nanotechnology, Vol. 3. Edited by H. S. Nalwa. American Scientific Publishers, Los Angeles, 2004.
78. C. Durkan and M. E. Welland, "Investigations into Local Ferroelectric Properties by Atomic Force Microscopy," Ultramicroscopy, 82, 141-8 (2000).
79. A. Gruverman, O. Kolosov, J. Hatano, K. Takahashi, and H. Tokumolo, "Domain Structure and Polarization Reversal in Ferroelectrics Studied by Atomic Force Microscopy," J. Vac. Sci. Technol., B 13, 1095-9 (1995).
80. K. Franke, H. Huelz, and M. Weihnacht, "How to Extract Spontaneous Polarization Information from Experimental Data in Electric Force Microscopy," Surf. Sci., 415, 178-82 (1998).
81. S. Hong, J. Woo, H. Shin, J. U. Jeon, Y. E. Park, E. L. Colla, N. Setter, E. Kim, and K. No, "Principle of Ferroelectric Domain Imaging Using Atomic Force Microscope," J. Appl. Phys., 89, 1377-86 (2001).
82. S. V. Kalinin and D. A. Bonnell, "Imaging Mechanism of Piezoresponse Force Microscopy of Ferroelectric Surfaces," Phys. Rev. B, 65, 125408 (2002).
83. C. Harnagea, "Local Piezoelectric Response and Domain Structures in Ferroelectric Thin Films Investigated by Voltage Modulated Force Microscopy," Dr. Rer. Nat. Thesis, Martin-Luther-Universität Halle Wittenberg, Halle, 2001, pp. 1-97.
84. C. Ganpule, "Nanoscale Phenomena in Ferroelectric Thin Films," Ph.D. Thesis, University of Maryland, College Park, 2001.
85. M. Abplanalp, "Piezoresponse Scanning Force Microscopy of Ferroelectric Domains," Ph.D. Thesis, Swiss Federal Institute of Technology, Zurich, 2001.
86. S. V. Kalinin, "Nanoscale Phenomena at Oxide Surfaces and Interfaces by Scanning Probe Microscopy," Ph.D. Thesis, University of Pennsylvania, Philadelphia, 2002.
87. S. V. Kalinin and D. A. Bonnell, "Contrast Mechanism Maps for Piezoresponse Force Microscopy," J. Mater. Res., 17 [5] 936-9 (2002).
88. S. V. Kalinin, E. Karapetian, and M. Kachanov, "Nanoeleetromechanics of Piezoresponse Force Microscopy," Phys. Rev. B, 70, 184101 (2004).
89. L. M. Eng, H. J. Güntherodt, G. A. Schneider, U. Kopke, and J. Munoz Saldana, "Nanoscale Reconstruction of Surface Crystallography from Three-Dimensional Polarization Distribution in Ferroelectric Barium-Titanate Ceramics," Appl. Phys. Lett., 74, 233-5 (1999).
90. A. Roelofs, U. Boettger, R. Waser, F. Schlaphof, S. Trogisch, and L. M. Eng, "Differentiating 180° and 90° Switching of Ferroelectric Domains with Three-Dimensional Piezoresponse Force Microscopy," Appl. Phys. Lett., 77, 3444-6 (2000).
91. C. Harnagea, A. Pignolet, M. Alexe, and D. Hesse, "Piezoresponse Scanning Force Microscopy: What Quantitative Information Can We Really Get Out of the Piezoresponse Measurements on Ferroelectric Thin Films," Integr. Ferroelectr., 38, 23-9 (2001).
92. B. J. Rodriguez, A. Gruverman, A. I. Kingon, R. J. Nemanich, and J. S. Cross, "Three-Dimensional High-Resolution Reconstruction of Polarization in Ferroelectric Capacitors by Piezoresponse Force Microscopy," J. Appl. Phys., 95 [4] 1958-62 (2004).
93. S. V. Kalinin, B. J. Rodriguez, S. Jesse, J. Shin, A. P. Baddorf, P. Gupta, H. Jain, D. B. Williams, and A. Gruverman, "Vector Piezoresponse Force Microscopy," to be published.
94. S. V. Kalinin, B. J. Rodriguez, S. Jesse. A. Gruverman, "Orientational Imaging by Electromechanical Scanning Probe Microscopy," to be Submitted.
95. V. Likodimos, M. Labardi, and M. Allegrini, "Kinetics of Ferroelectric Domains Investigated by Scanning Force Microscopy," Phys. Rev. B, 61, 14440-7 (2000).
96. C. Harnagea, M. Alexe, D. Hesse, and A. Pignolet, "Contact Resonances in Voltage-Modulated Force Microscopy," Appl. Phys. Lett., 83 (2) 338-40 (2003).
97. 3/Pt Interface," Appl. Phys. Lett., 81, 3215-7 (2002).
98. A. Roelofs, T. Schneller, K. Szot, and R. Waser, "Piezoresponse Force Microscopy of Lead Titanate Nanograins Possibly Reaching the Limit of Ferroelectricity," Appl. Phys. Lett., 81, 5231-3 (2002).
99. A. Roelofs, "Size Effects in Ferroelectric Thin Films," Ph.D. Thesis, RTWH Aachen, Germany, 2004.
100. 3:La Thin Films Via Scanning Force Microscopy," Appl. Phys. Lett., 82, 2127-9 (2002).
101. M. Abplanalp, J. Fousek, and P. Günter, "Higher Order Ferroic Switching Induced by Scanning Force Microscopy," Phys. Rev. Lett., 86, 5799-802 (2001).
102. 3 Thin Film," Appl. Phys. Lett., 83, 2028-30 (2003).
103. A. Gruverman, Private Communications.
104. M. Alexe, A. Gruverman, C. Harnagea, N. D. Zakharov, A. Pignolet, D. Hesse, and J. F. Scott, "Switching Properties of Self-Assembled Ferroelectric Memory Cells," Appl. Phys. Lett., 75, 1158-60 (1999).
105. 9 Thin Films by Piezoresponse Force Microscopy," Appl. Phys. Lett., 85, 795-8 (2004).
106. R. Shao and D. A. Bonnell, "Scanning Probes of Nonlinear Properties in Complex Materials," Jpn. J. Appl. Phys., 43, 4471-6 (2004).
107. Q. M. Zhang, W. Y. Pan, and L. E. Cross, "Laser Interferometer for the Study of Piezoelectric and Electrostrictive Strains," J. Appl. Phys., 63, 2492-4 (1988).
108. L. Guy and Z. Zheng. "Piezoelectricity and Electrostriction in Ferroelectric Polymers," Fcrroelectrics, 264 [1-4] 1691-6 (2001).
109. T. Furukawa and N. Seo, "Electrostriction as the Origin of Piezoelectricity in Ferroelectric Polymer," Jpn. J. Appl. Phys., 29, 675-80 (1990).
110. C. Gao and X. D. Xiang, "Quantitative Microwave Near-Field Microscopy of Dielectric Properties," Rev. Sci. Instrum.. 69, 3846-51 (1998).
111. Y. Cho, A. Kirihara, and T. Saeki, "Scanning Nonlinear Dielectric Microscope," Rev. Sci. Instrum., 67, 2297-303 (1996).
112. 3 Thin Films," Appl. Phys. Lett., 75, 3180-2 (1999).
113. D. E. Steinhauer, C. P. Vlahacos, S. K. Dutta, F. C. Wellstood, and S. M. Anlage, "Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope," Appl. Phys. Leu., 71, 1736-8 (1997).
114. 7-δ Bicrystal Grain Boundaries," Appl. Phys. Lett., 82, 1893-5 (2003).
115. L. M. Levinson (ed.), Electronic Ceramics: Properties, Devices and Applications. Marcel Dekker Inc., New York, 1988.
116. D. R. Clarke, "On the Detection of Thin Intergranular Films by Electron Microscopy," Ultramicroscopy, 4, 33-44 (1979).
117. Y.-M. Chiang, W. D. Kingery, and L. M. Levinson, "Compositional Changes Adjacent to Grain Boundaries During Electrical Degradation of a ZnO Varistor," 53, 1765-8 (1982).
118. S. B. Desu and D. A. Payne, "Interfacial Segregation in Perovskiles. I. Theory," J. Am. Ceram. Sac., 73, 3391-7 (1990).
119. J. A. S. Ikeda and Y.-M. Chiang. "Space Charge Segregation at Grain Boundaries in Titanium Dioxide: I, Relationship Between Lattice Defect Chemistry and Space Charge Potential," J. Am. Ceram. Soc., 76, 2437-46 (1993).
120. J. D. Russell, D. C. Halls, and C. Leach, "The Relationship Between Crystal Misorientation and Conductive Mode Contrast of Grain Boundaries in Additive-Free Zinc Oxide," J. Mater. Sci., 32, 4585-9 (1997).
121. Z. Ling, "A REBIC and CL Study of Interfaces in a Zinc Oxide Based Varistor," J. Mater. Sci., 34, 6133-5 (1999).
122. J. Fleig, S. Rodewald, and J. Maier, "Spatially Resolved Measurements of Highly Conductive and Highly Resistive Grain Boundaries Using Microcontact Impedance Speetroscopy," Sol. State Ionics. 136-137, 905-911 (2000).
123. G. E. Pike and C. H. Seager, "The dc Voltage Dependence of Semiconductor Grain-Boundary Resistance," J. Appl. Phys., 50, 3414-22 (1979).
124. R. A. De Souza, J. Fleig, J. Maier, O. Kienzle, Z. Zhang, W. Sigle, and M. Rühle, "Electrical and Structural Characterization of a Low-Angle Tilt Grain Boundary in Iron-Doped Strontium Titanate," J. Am. Ceram. Soc., 86, 922-8 (2003).
125. 3," Phys. Rev. B, 66, 214112 (2002).
126. F. Ernst, O. Kienzle, and M. Rühle, "Structure and Composition of Grain Boundaries in Ceramics," J. Eur. Ceram. Soc., 19, 665-73 (1999).
127. 3," Phys. Rev. Lett., 86, 4056-9 (2001).
128. N. D. Browning and S. J. Pennycook, "Direct Experimental Determination of the Atomic Structure at Internal Interfaces," J. Phys., D 29, 1779-98 (1996).
129. K. D. Johnson and V. P. Dravid, "Grain Boundary Barrier Breakdown in Niobium Donor Doped Strontium Titanate Using In Situ Electron Holography," Appl. Phys. Lett., 74, 621-3 (1999).
130. 3," Appl. Phys. Lett., 74, 2638-40 (1999).
131. 3 Bicrystals," Phys. Rev. B, 62, 10419-30 (2000).
132. V. Ravikumar, R. P. Rodrigues, and V. P. Dravid, "Direct Imaging of Spatially Varying Potential and Charge Across Internal Interfaces in Solids," Phys. Rev. Lett., 75, 4063-6 (1995).
133. Z. Mao, R. E. Dunin-Borkowski, G. B. Boothroyd, and K. M. Knowles, "Direct Measurement and Interpretation of Electrostatic Potentials at 24° [001] Tilt Boundaries in Undoped and Niobium-Doped Strontium Titanate Bicrystals," J. Am, Ceram. Soc., 81, 2917-43 (1998).
134. 3," J. Phys., D 29, 1799-806 (1996).
135. 3," Phil. Mag., A 73, 625 (1996).
136. N. D. Browning, H. O. Moltaji, and J. P. Buban, "Investigation of Three-Dimensional Grain-Boundary Structures in Oxides Through Multiple-Scattering Analysis of Spatially Resolved Electron-Energy-Loss Spectra," Phys. Rev. B, 58, 8289 (1998).
137. 3," Interf. Sci., 8, 199-208 (2000).
138. 3," Phys. Rev. B, 60, 2416-24 (1999).
139. R. Astala and P. D. Bristowe, "First-Principles Calculations of an Oxygen Deficient 13 (111) [101] Grain Boundary in Strontium Titanate," J. Phys.: Condens. Matter, 14, 6455-67 (2002).
140. 3," Phys. Rev. B. 66, 94108 (2002).
141. Z. Zhang, W. Sigle, F. Phillips, and M. Rüble, "Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries," Science, 302, 846-9 (2003).
142. E. McDaniel, S. McClain, and J. W. P. Hsu, "Nanometer Scale Polarimetry Studies Using a Near Field Optical Microscope," Appl. Opt., 37, 84-92 (1998).
143. 3 Bicrystals," J. Appl. Phys., 84, 189-93 (1998).
144. D. A. Bonnell and S. V. Kalinin, "Non-Linear Dielectric Properties at Oxide Grain Boundaries," Z. Metallkd., 94, 188-94 (2003).
145. R. Shao and D. A. Bonnell, unpviblished.
146. 3 Ceramics: Evidence of Polar Grain Boundaries," Phys. Rev. B, 64, 184111 (2001).
147. S. V. Kalinin and D. A. Bonnell, "Screening Phenomena on Oxide Surfaces and its Implications for Local Electrostatic and Transport Measurements," Nano Lett., 4, 555-60 (2004).
148. R. Shao and D. A. Bonnell, Unpublished.
149. M. E. Lines, and A. M. Glass (eds.), Principles and Applications of Ferroelectric and Related Materials. Clarendon Press, Oxford, 1977.
150. L. L. Hench and J. K. West (eds.), Principles of Electronic Ceramics. Wiley, New York, 1990.
151. N. Setter and E. L. Colla (eds.), Ferroelectric Ceramics. Birkhauser Verlag, Basel, 1993.
152. D. L. Polla and L. F. Francis, "Processing and Characterization of Piezoelectric Materials and Integration into Microelectromechanical Systems," Annu. Rev. Mater. Sci., 28, 563-97 (1998).
153. D. M. Dabbs and I. A. Aksay, "Self-Assembled Ceramics Produced by Complex-Fluid Templation," Anna. Rev. Phys. Chem., 51, 601-22 (2000).
154. U. P. Schonholzer and L. J. Gauckler, "Ceramic Parts Patterned in the Micrometer Range," Adv. Mater., 11, 630-2 (1999).
155. 3 on Silicon," J. Phys., D 32, R1-18 (1999).
156. M. Suzuki, "Review on Future Ferroelectric Nonvolatile Memory: FeRAM from the Point of View of Epitaxial Oxide Thin Films," J. Ceram. Soc. Jpn., 103, 1099-111 (1995).
157. J. Scott, Ferroelectric Memories. Springer Verlag, Berlin, 2000.
158. J. S. Speck and W. Pompe, "Domain Configurations Due to Multiple Misfit Relaxation Mechanisms in Epitaxial Ferroelectric Thin Films. I. Theory," J. Appl. Phys., 76, 466-76 (1994).
159. J. S. Speck, A. Seifert, W. Pompe, and R. Ramesh, "Domain Configurations Due to Multiple Misfit Relaxation Mechanisms in Epitaxial Ferroelectric Thin Films. II. Experimental Verification and Implications," J. Appl. Phys., 76, 477-83 (1994).
160. V. Nagarajan, I. G. Jenkins, S. P. Alpay, H. Li, S. Aggarwal, L. SalamancaRiba, A. L. Roylburd. and R. Ramesh, "Thickness Dependence of Structural and Electrical Properties in Epitaxial Lead Zirconate Titanate Films," J. Appl. Phys., 86, 595-602 (1999).
161. Y. L. Li, S. Y. Hu, Z. K. Liu, and L. Q. Chen, "Effect of Substrate Constraint on the Stability and Evolution of Ferroelectric Domain Structures in Thin Films," Acta Mater., 50, 395-411 (2002).
162. F. Jona and G. Shirane. Ferroelectric Crystals. Dover Publications, New York, 1993.
163. G. A. Smolenskii, V. A. Bokov, V. A. Isupov, N. N. Krainik, R. E. Pasynkov, and A. I. Sokolov, Ferroelectrics and Related Materials. Gordon and Breach, New York, 1984.
164. B. Jaffe, W. R. Cook Jr., and H. Jaffe, Piezoelectric Ceramics. Academic Press, London, 1971.
165. M. L. Mulvihill, K. Uchino, Z. Li, and W. Cao, "In-Situ Observation of the Domain Configurations During the Phase Transitions in Barium Titanate," Philos. Mag., 874, 25-36 (1996).
166. 3 Crystals," Appl. Phys. Lett., 75, 2482-4 (1999).
167. 3 by Means of Scanning Electron Microscopy," Phys. Stat. Sol., A 173, 495-503 (1999).
168. A. A. Sogr, "Domain Structure of Ferroelectrics Observed in the Scanning Electron Microscope," Ferroelectric, 97, 47-57 (1989).
169. I. M. Reaney, "TEM Observations of Domains in Ferroelectric and Nonferroelectric Perovskites," Ferroelectrics, 172, 115-25 (1995).
170. L. A. Bursill and P. J. Lin, "Electron Microscopic Studies of Ferroelectric Crystals," Ferroelectrics, 70, 191-203 (1986).
171. 3," Phase Transitions, 46, 77-88 (1994).
172. Z. Xu, D. Viehland, P. Yang, and D. A. Payne, "Hot-Stage Transmission Electron Microscopy Studies of Phase Transformations in Tin-Modified Lead Zirconate Titanate," J. Appl. Phys., 74, 3406-13 (1993).
173. O. O. Popoola and W. M. Kriven, "Is the Hagen-Strunk Multiplication Mechanism of Misfit Dislocations in Heteroepitaxial Layers Probable?," Philos. Mag. Lett., 75, 1-8 (1997).
174. E. Snoeck, C. Roucau, P. Baules, M. J. Casanove, M. Fagot, B. Astie, and J. Degauque, "Use of In Situ TEM Experiments for Phase Transition Studies," Micros., Microanal., Microstruct., 4, 249-64 (1993).
175. 3). IV. Polarization Reversal and Field Induced Phase Transformation," Phys. Stat. Sol., A 62, 657-64 (1980).
176. H. Riege, I. Boscolo, J. Handerek, and U. Herleb, "Features and Technology of Ferroelectric Electron Emission," J. Appl. Phys., 84, 1602-17 (1998).
177. D. Shur and G. Rosenman, "Figures of Merit for Ferroelectric Electron Emission Cathodes," J. Appl. Phys., 80, 3445-50 (1996).
178. 3 Surfaces," Appl. Phys. Lett., 85, 2316-8 (2004).
179. J. L. Giocondi and G. S. Rohrer, "Spatially Selective Photochemical Reduction of Silver on the Surface of Ferroelectric Barium Titanate," Chem. Mater., 13 [2] 241-2 (2001).
180. S. V. Kalinin, D. A. Bonnell, T. Alvarez, X. Lei, Z. Hu, J. H. Ferris, Q. Zhang, and S. Dünn, "Atomic Polarization and Local Reactivity on Ferroelectric Surfaces: A New Route Toward Complex Nanostructures." Nona Lett., 2 [6] 589-93 (2002).
181. S. V. Kalinin, D. A. Bonnell, T. Alvarez, X. Lei, Z. Hu, R. Shao, and J. H. Ferris, "Ferroelectric Lithography of Multi Component Nanostructures," Adv. Mater., 16, 795-9 (2004).
182. V. M. Fridkin, Ferroelectric Semiconductors, Consultants Bureau, New York, 1980.
183. 7-x Films," Science, 284, 1152-5 (1999).
184. 3) Heterostructures," Science, 276, 1100-3 (1997).
185. 3 Crystals by Atomic Force Microscopy," J. Appl. Phys., 84, 6795-9 (1998).
186. 3 Single Crystals," Jpn, J. Appl. Phys., A 36, 2207-11 (1997).
187. M. Takashige, S.-I. Hamazaki, N. Fukurai, F. Shimizu, and S. Kojima, "Atomic Force Microscope Observation of Ferroelectrics: Barium Titanate and Rochelle Salt," Jpn. J. Appl. Phys., B 35, 5181-4 (1996).
188. M. Takashige, S.-I. Hamazaki, F. Shimizu, and S. Kojima, "Temperature Dependent Surface Images of Barium Titanate and Rochelle Salt Observed by Atomic Force Microscopy," Ferroelectrics, 240, 1359-66 (2000).
189. S. Balakumar, J. B. Xu, J. X. Ma, S. Ganesamoorlhy, and I. H. Wilson,
190. 3 by Atomic Force, Optical and Scanning Electron Microscopy Techniques," J. Phys., D 31, 2846-53 (1998).
191. L. M. Eng, M. Friedrich, J. Fousek, and P. Günter, "Deconvolution of Topographic and Ferroelectric Contrast by Noneontaet and Friction Force Microscopy," J. Vac. Sci. Technol., B 14, 1191-6 (1996).
192. H. Bluhm, U. D. Schwartz, and R. Wicsendanger, "Origin of the Ferroelectric Domain Contrast Observed in Lateral Force Microscopy," Phys. Rev. B, 57, 161-9 (1998).
193. A. Corrcia, J. Massanell, N. Garcia, A. P. Levanyuk, A. Zlatkin, and J. Przeslawski, "Friction Force Microscopy Study of a Cleaved Ferroelectric Surface: Time and Temperature Dependence of the Contrast, Evidence of Domain Structure Branching," Appl. Phys. Lett., 68, 2796-8 (1996).
194. R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, "Surface and Domain Structures of Ferroelectric Crystals Studied with Scanning Force Microscopy," J. Appl. Phys., 74, 7461-71 (1993).
195. R. Lüthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H.-J. Günlherodt, "Statics and Dynamics of Ferroelectric Domains Studied with Scannine Force Microscopy," J. Vac. Sci. Technol., B 12, 2451-5 (1996).
196. F. Saurenbach and B. D. Terris, "Imaging of Ferroelectric Domain Walls by Force Microscopy," Appl. Phys. Lett., 56, 1703-5 (1990).
197. J. Ohgami, Y. Sugawara, S. Morita, E. Nakamura, and T. Ozaki, "Determination of Sign of Surface Charges of Ferroelectric TGS Using Electrostatic Force Microscope Combined with the Voltage Modulation Technique," Jpn. J. Apnl. Phys., A 35, 2734-9 (1996).
198. L. M. Eng, J. Fousek, and P. Günter, "Ferroelectric Domains and Domain Boundaries Observed by Scanning Force Microscopy," Ferroelectrics, 191, 211-8 (1997).
199. S. V. Kalinin and D. A. Bonnell, "Electric Scanning Probe Imaging and Modification of Ferroelectric Surfaces;" pp. 1-43 in Nanosmte Characterization of Ferroelectric Materials, Edited by M. Alexe and A. Gruverman. Springer, Berlin, Germany, 2004.
200. E. Z. Luo, Z. Xie, J. B. Xu, I. H. Wilson, and L. H. Zhao, "In Situ Observation of the Ferroelectric-Paraelcctric Phase Transition in a Triglycine Sulfate Single Crystal by Variable-Temperature Electrostatic Force Microscopy," Phys. Rev. B, 61, 203-6 (2000).
201. J. W. Hong, S. I. Park, and Z. G. Kirn, "Measurement of Hardness, Surface Potential, and Charge Distribution with Dynamic Contact Mode Electrostatic Force Microscope," Rev. Sci. Instrum., 70, 1735-9 (1999).
202. L. M. Eng, H. J. Güntherodt, G. Rosenman, A. Skliar, M. Oron, M. Kalz, and D. Eger, "Nondestructive Imaging and Characterization of Ferroelectric Domains in Periodically Poled Crystals," J. Appl. Phys., 83, 5973-7 (1998).
203. V. Likodimos, X. K. Orlik, L. Pardi, M. Labardi, and M. Allegrini, "Dynamical Studies of the Ferroelectric Domain Structure in Triglycine Sulfate by Voltage-Modulated Scanning Force Microscopy," J. Appl. Phys., 87, 443-51 (2000).
204. 2 System by Piezoresponse Imaging," J. Mater. Res., 16, 329-32 (2001).
205. T. Tybell, C. H. Ahn, and J.-M. Triscone, "Ferroelectricity in Thin Perovskite Films," Appl. Phys. Lett., 75, 856-8 (1999).
206. X. K. Orlik, V. Likodimos, L. Pardi, M. Labardi, and M. Allegrini, "Scanning Force Microscopy Study of the Ferroelectric Phase Transition in Triglycine Sulfate," Appl. Phys. Lett., 76, 1321-4 (2000).
207. V. Likodimos, M. Labardi, and M. Allegrini, "Domain Pattern Formation and Kinetics on Ferroelectric Surfaces Under Thermal Cycling Using Scanning Force Microscopy," Phys. Rev. B, 66, 024104 (2002).
208. V. Nagarajan, A. Roytburd, A. Stanishevsky, S. Praserlohoung, T. Zhao, L. Chen, J. Melngailis, O. Auciello, and R. Ramesh, "Dynamics of Ferroelaslic Domains in Ferroelectric Thin Films," Nature Mater., 2, 43-7 (2003).
209. 3 Thin Film Capacitors with Pt Electrodes," Appl. Phys. Lett., 72, 2763-6 (1998).
210. S. Hong, "Polarization Switching and Fatigue of Ferroelectric Thin Films Studied by PFM;" pp. 111-35 in Nanoscale Phenomena in Ferroelectric Thin Films, Edited by S. Hong. Kluwer, Dordrecht, 2004.