|
|
Volumn 80-81, Issue , 2001, Pages 33-44
|
|
Local potential at atomically abrupt oxide grain boundaries by scanning probe microscopy
|
|
Author keywords
Electrostatic force microscopy; Grain boundary; Oxide; Scanning surface potential microscopy; Transport properties
|
|
Indexed keywords
CERAMIC MATERIALS;
INTERFACES (MATERIALS);
MICROSCOPIC EXAMINATION;
MICROSTRUCTURE;
OXIDES;
POLYCRYSTALLINE MATERIALS;
SCHOTTKY BARRIER DIODES;
TRANSPORT PROPERTIES;
CURRENT MAP RECONSTRUCTION;
ELECTROSTATIC FORCE MICROSCOPY;
SCANNING PROBE MICROSCOPY;
SCANNING SURFACE POTENTIAL MICROSCOPY;
GRAIN BOUNDARIES;
|
|
EID: 0034831651
PISSN: 10120394
EISSN: None
Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.80-81.33 Document Type: Conference Paper |
|
Times cited : (6)
|
|
References (36)
|
