Determination of sign of surface charges of ferroelectric TGS using electrostatic force microscope combined with the voltage modulation technique

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 5 SUPPL. A, 1996, Pages 2734-2739

  Ohgami, Junji ^a   Sugawara, Yasuhiro ^a   Morita, Seizo ^a   Nakamura, Eiji ^a   Ozaki, Toru ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

AFM; Domain wall; EFM; Ferroelectrics; Surface charge; Surface topography; TGS

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CHARGE; ELECTROSTATIC DEVICES; FERROELECTRIC MATERIALS; FORCE MEASUREMENT; FREQUENCY MODULATION; MICROSCOPES; PERMITTIVITY; Q FACTOR MEASUREMENT; SPURIOUS SIGNAL NOISE; VOLTAGE CONTROL;

CONTACT MODE; DOMAIN WALL; ELECTRIC FORCE CONSTANT; ELECTROSTATIC FORCE MICROSCOPE; FEEDBACK SIGNAL SPATIAL DISTRIBUTION; SURFACE CHARGE; SURFACE TOPOGRAPHY; VOLTAGE MODULATION TECHNIQUE;

SURFACE PHENOMENA;

EID: 0030145804     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.2734     Document Type: Article

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