Cryogenic scanning probe characterization of semiconductor nanostructures

Applied Physics Letters

Volumn 69, Issue 5, 1996, Pages 671-673

  Eriksson, M A ^a   Beck, R G ^a   Topinka, M ^a   Katine, J A ^a   Westervelt, R M ^a   Campman, K L ^b   Gossard, A C ^b  

^a HARVARD UNIVERSITY   (United States)

^b University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001526572     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117801     Document Type: Article

References (13)

1. For a review of scanned probe microscopy techniques see, Scanning Tunneling Microscopy II, edited by R. Wiesendanger and H.-J. Guntherodt (Springer, New York, 1995).
2. Y. Martin, D. W. Abraham, and H. K. Wickramasinghe, Appl. Phys. Lett. 52, 1103 (1988).
3. D. W. Abraham, C. Williams, J. Slinkman, and H. K. Wickramasinghe, J. Vac. Sci. Technol. B 9, 703 (1991).
4. Y. Huang, C. C. Williams, and J. Slinkman, Appl. Phys. Lett. 66, 344 (1995).
5. C. Shafai, D. J. Thomson, M. Simard-Normandin, G. Mattiussi, and P. J. Scanlon, Appl. Phys. Lett. 64, 342 (1994).
6. B. D. Terris, R. C. Barrett, and H. J. Mamin, in Scanning Probe Microscopies II (SPIE, Bellingham, WA, 1993), Vol. 1855, p. 195.
7. M. Dreyer and R. Wiesendanger, Appl. Phys. A 61, 357 (1995).
8. H. Baranger and D. A. Stone, Phys. Rev. Lett. 63, 414 (1989).
9. L. W. Molenkamp, A. A. M. Staring, C. W. J. Beenakker, R. Eppenga, C. E. Timmering, J. G. Williamson, C. J. P. M Harmans, and C. T. Foxon, Phys. Rev. B 41, 1274 (1990).
10. K. L. Shepard, M. L. Roukes, and B. P. Van der Gaag, Phys. Rev Lett. 68, 2660 (1992).
11. Similar to T. R. Albrecht, P. Grutier, D. Rugar, and D. P. E. Smith, Ultramicroscopy 42, 1638 (1992).
12. Park Scientific Instruments, Sunnyvale. CA 94089.
13. C. W. J. Beenakker and H. van Houten, in Solid State Physics, edited by H. Ehrenreich and D. Turnbull (Academic, San Diego, 1991), Vol. 44.