Force-distance curves by atomic force microscopy

Surface Science Reports

Volumn 34, Issue 1-3, 1999, Pages 1-3

  Cappella, B ^a   Dietler, G ^a  

^a UNIVERSITY OF LAUSANNE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; ELASTICITY; FORCE MEASUREMENT; HYDRATION; HYDROPHOBICITY; VAN DER WAALS FORCES;

FORCE-DISTANCE CURVES; HAMAKER CONSTANT; SOLVATION;

ATOMIC FORCE MICROSCOPY;

EID: 0033153911     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-5729(99)00003-5     Document Type: Article

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