Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy

Applied Physics Letters

Volumn 74, Issue 23, 1999, Pages 3522-3524

  Bridger, P M ^a   Bandic Z Z ^a   Piquette, E C ^a   McGill, T C ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001039850     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124148     Document Type: Article

References (23)

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