Investigations into local ferroelectric properties by atomic force microscopy

Ultramicroscopy

Volumn 82, Issue 1-4, 2000, Pages 141-148

  Durkan, C ^a   Welland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTABILITY AND DECIDABILITY; DIELECTRIC FILMS; ELECTRIC FIELD EFFECTS; ELECTRIC POTENTIAL; NANOSTRUCTURED MATERIALS; PIEZOELECTRIC MATERIALS; POLARIZATION; THIN FILMS;

LEAD ZIRCONATE TITANATE; SPHERE-PLANE MODEL;

LEAD COMPOUNDS;

LEAD; TITANIUM DERIVATIVE; ZIRCONIUM DERIVATIVE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; ELECTRIC POTENTIAL; EXPERIMENTAL MODEL; PIEZOELECTRICITY; VALIDATION PROCESS;

EID: 0033979339     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00134-5     Document Type: Article

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