Principle of ferroelectric domain imaging using atomic force microscope

Journal of Applied Physics

Volumn 89, Issue 2, 2001, Pages 1377-1386

  Hong, Seungbum ^a,b,c   Woo, Jungwon ^a   Shin, Hyunjung ^b   Jeon, Jong Up ^b   Pak, Y Eugene ^b   Colla, Enrico L ^c   Setter, Nava ^c   Kim, Eunah ^a   No, Kwangsoo ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001303923     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1331654     Document Type: Article

References (12)

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