Quantitative analysis of nanoscale switching in SrBi 2Ta 2O 9 thin films by piezoresponse force microscopy

Applied Physics Letters

Volumn 85, Issue 5, 2004, Pages 795-797

  Kalinin, Sergei V ^a   Gruverman, Alexei ^b   Bonnell, Dawn A ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b North Carolina State University   (United States)

^c UNIVERSITY OF PENNSYLVANIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HYSTERESIS LOOPS; NANOSCALE SWITCHING; PIEZORESPONSE FORCE MICROSCOPY (PFM); POLARIZATION ORIENTATION;

COERCIVE FORCE; CRYSTAL ORIENTATION; ELECTRIC POTENTIAL; GRAIN SIZE AND SHAPE; HYSTERESIS; STRONTIUM COMPOUNDS; SWITCHING; VOLUME FRACTION; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

THIN FILMS;

EID: 4344571628     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1775881     Document Type: Article

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