Spatially resolved measurements of highly conductive and highly resistive grain boundaries using microcontact impedance spectroscopy

Solid State Ionics

Volumn 136-137, Issue , 2000, Pages 905-911

  Fleig, J ^a   Rodewald, S ^a   Maier, J ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; MICROELECTRODES; POLYCRYSTALLINE MATERIALS; SILVER COMPOUNDS; SPECTROSCOPIC ANALYSIS;

MICROCONTACT IMPEDANCE SPECTROSCOPY; STRONTIUM TITANATE;

STRONTIUM COMPOUNDS;

EID: 18844480538     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(00)00522-1     Document Type: Article

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