Direct imaging of submicron-scale defect-induced birefringence in SrTiO3 bicrystals

Journal of Applied Physics

Volumn 84, Issue 1, 1998, Pages 189-193

  McDaniel, E B ^a,b   Hsu, J W P ^a  

^a University of Virginia ^*  (United States)

^b University Research Foundation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001637589     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368015     Document Type: Article

References (44)

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