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Volumn 84, Issue 1, 1998, Pages 189-193

Direct imaging of submicron-scale defect-induced birefringence in SrTiO3 bicrystals

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EID: 0001637589     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368015     Document Type: Article
Times cited : (11)

References (44)
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    • Nikko Hitech Inc., San Jose, CA
    • Nikko Hitech Inc., San Jose, CA.
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    • note
    • The actual angle between the two sides of a 36° bicrystal is 36.8°.
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    • note
    • avg).
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    • note
    • 3 refractive index. The dependence of transmission contrast using different objectives also confirms that the observed contrast is an index, not an absorption phenomenon.
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    • translated by E. Gros, edited by W. Johnson Pergamon, New York, Chap. II
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    • note
    • 0 sin(2πft) into the +45° polarization component, where the modulation frequency f is the resonant frequency (50 kHz) of the PEM quartz element. The emerging light has a polarization state, which is varying in ellipticity at f and has its principle axis at -90°. The quarter-wave plate (oriented at 0°) transforms this elliptically polarized light into linearly polarized light with its orientation varying sinusoidally at the modulation frequency. This polarized light is then coupled into a single-mode optical fiber leading to the NSOM tip. The light emitted from the tip aperture and transmitted through the sample is collected by a conventional microscope objective lens. The collected light then passes through a circular polarization analyzer which transforms polarization state variation into intensity variation before reaching a photomultiplier tube. The PMT signal, therefore, contains information about the birefringence of the sample and the overall transmittance of the sample.
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    • Optical contrast is measured using a 100X0.7 NA objective
    • Optical contrast is measured using a 100X0.7 NA objective.
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    • private communications
    • K. Takahashi (private communications).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.