Friction force microscopy study of a cleaved ferroelectric surface: Time and temperature dependence of the contrast, evidence of domain structure branching

Applied Physics Letters

Volumn 68, Issue 20, 1996, Pages 2796-2798

  Correia, A ^a   Massanell, J ^a   Garcia N ^a   Levanyuk, A P ^a   Zlatkin, A ^a,b   Przeslawski, J ^a,c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

^c UNIVERSITY OF WROC AW   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; CRYSTAL STRUCTURE; ELECTRIC FIELD EFFECTS; FERROELECTRIC MATERIALS; FRICTION; REFRACTIVE INDEX; SILICON NITRIDE; SULFUR COMPOUNDS; SURFACES;

CHARGE CARRIER REDISTRIBUTION; CLEAVED SURFACE; DOMAIN STRUCTURE BRANCHING; REFRACTION LAW; SCANNING FRICTION FORCE MICROSCOPY; TRIGLYCINE SULFATE;

ATOMIC FORCE MICROSCOPY;

EID: 0030148745     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116610     Document Type: Article

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