Direct Atom-Resolved Imaging of Oxides and Their Grain Boundaries

Science

Volumn 302, Issue 5646, 2003, Pages 846-849

  Zhang, Zaoli ^a   Sigle, Wilfried ^a   Phillipp, Fritz ^a   Rühle, Manfred ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTALLOGRAPHY; GRAIN BOUNDARIES; OXYGEN; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

SUBLATTICES;

IMAGING TECHNIQUES;

OXIDE; OXYGEN; STRONTIUM; TITANIUM DERIVATIVE;

ARTICLE; ATOM; CALCULATION; CRYSTAL STRUCTURE; GRAIN; IMAGING SYSTEM; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0242332193     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1089785     Document Type: Article

References (15)

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15. We thank U. Salzberger for excellent TEM specimen preparation, R. Höschen for his help during the operation of the ARM1250, and C. T. Koch and G. Richter for helpful discussions with the image simulations.