Nondestructive imaging and characterization of ferroelectric domains in periodically poled crystals

Journal of Applied Physics

Volumn 83, Issue 11, 1998, Pages 5973-5977

  Eng, L M ^a   Guntherodt H J ^a   Rosenman, G ^b   Skliar, A ^b   Oron, M ^c   Katz, M ^c   Eger, D ^c  

^a UNIVERSITY OF BASEL   (Switzerland)

^b TEL AVIV UNIVERSITY   (Israel)

^c SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001226453     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367462     Document Type: Article

References (36)

1. M. Hour and P. D. Townsend, J. Phys. D: Appl. Phys. 28, 1747 (1995).
2. L. E. Myers, R. C. Eckard, M. M. Fejer, R. L. Byer, W. R. Rosenberg, and J. W. Pierce, J. Opt. Soc. Am. B 12, 2102 (1995).
3. G. Rosenman, V. D. Kugel, and D. Shur, Ferroelectrics 172, 7 (1995).
4. H. Ito, C. Takyu, and H. Ihaba, Electron. Lett. 27, 1221 (1991).
5. M. Yamada, N. Nada, M. Saitoh, and K. Watanabe, Appl. Phys. Lett. 62, 435 (1993).
6. S. N. Zhu, Y. Y. Zhu, Z. Y. Zhang, H. Shu, H. F. Wang, J. F. Hong, C. Z. Ge, and N. B. Lung, J. Appl. Phys. 77, 5481 (1995).
7. L. E. Myers, G. D. Miller, R. C. Eckard, M. M. Fejer, R. L. Byer, and W. R. Rosenberg, Opt. Lett. 20, 52 (1995).
8. Q. Chen and W. P. Risk, Electron. Lett. 30, 1516 (1994).
9. Q. Chen and W. P. Risk, Electron. Lett. 32, 107 (1996).
10. Y. A. Galaichuk, V. A. Dyakov, N. I. Likholit, V. S. Ovechko, R. A. Petrenko, T. V. Rozhdestvenskaya, V. L. Strizhevskii, A. I. Khil'chevskii, and Y. N. Yashkir, Bull. Acad. Sci. USSR, Phys. Ser. 52, 131 (1988).
11. M. Oron, D. Eger, M. Katz, G. Rosenman, and A. Skliar, Electron. Lett. 33, 807 (1997); A. Englander, R. Lavi, M. Katz, M. Oron, D. Eger, E. Lebiush, G. Rosenman, and A. Skliar, Opt. Lett. 22, 1598 (1997).
12. M. Oron, D. Eger, M. Katz, G. Rosenman, and A. Skliar, Electron. Lett. 33, 807 (1997); A. Englander, R. Lavi, M. Katz, M. Oron, D. Eger, E. Lebiush, G. Rosenman, and A. Skliar, Opt. Lett. 22, 1598 (1997).
13. A. Skliar, G. Rosenman, Y. Lareah, N. Angert, M. Tseitlin, and M. Roth, Ferroelectrics 191, 187 (1997).
14. G. Rosenman, A. Skliar, Y. Lareah, N. Angert, M. Tseitlin, and M. Roth, Phys. Rev. B 54, 6222 (1996).
15. L. M. Eng, M. Friedrich, J. Fousek, and P. Günter, Ferroelectrics 186, 49 (1996).
16. L. M. Eng, M. Friedrich, J. Fousek, and P. Günter, J. Vac. Sci. Technol. B 14, 1191 (1996).
17. L. M. Eng, M. Friedrich, J. Fousek, and P. Günter, Ferroelectrics 191, 211 (1997).
18. M. Abplanalp, L. M. Eng, and P. Günter, Appl. Phys. A: Solids Surf. (to be published).
19. F. Saurenbach and B. D. Terris, Appl. Phys. Lett. 56, 1703 (1990); H. Haefke, R. Lüthi, K.-P. Meyer, and H.-J. Güntherodt, Ferroelectrics 151, 143 (1994); R. Lüthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Vac. Sci. Technol. B 12, 2451 (1994); R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Appl. Phys. 74, 7461 (1993).
20. F. Saurenbach and B. D. Terris, Appl. Phys. Lett. 56, 1703 (1990); H. Haefke, R. Lüthi, K.-P. Meyer, and H.-J. Güntherodt, Ferroelectrics 151, 143 (1994); R. Lüthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Vac. Sci. Technol. B 12, 2451 (1994); R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Appl. Phys. 74, 7461 (1993).
21. F. Saurenbach and B. D. Terris, Appl. Phys. Lett. 56, 1703 (1990); H. Haefke, R. Lüthi, K.-P. Meyer, and H.-J. Güntherodt, Ferroelectrics 151, 143 (1994); R. Lüthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Vac. Sci. Technol. B 12, 2451 (1994); R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Appl. Phys. 74, 7461 (1993).
22. F. Saurenbach and B. D. Terris, Appl. Phys. Lett. 56, 1703 (1990); H. Haefke, R. Lüthi, K.-P. Meyer, and H.-J. Güntherodt, Ferroelectrics 151, 143 (1994); R. Lüthi, H. Haefke, W. Gutmannsbauer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Vac. Sci. Technol. B 12, 2451 (1994); R. Lüthi, H. Haefke, K.-P. Meyer, E. Meyer, L. Howald, and H.-J. Güntherodt, J. Appl. Phys. 74, 7461 (1993).
23. L. M. Eng, M. Abplanalp, H. Pierhöfer, and P. Günter, Appl. Phys. Lett. (submitted).
24. L. M. Eng, M. Abplanalp, and P. Günter, Appl. Phys. A: Solids Surf. (to be published).
25. J. D. Beirlein and H. Vanherzeele, J. Opt. Soc. Am. B 6, 622 (1989).
26. P. A. Thomas, A. M. Glazer, and B. E. Watts, Acta Crystallogr. Sec. B 46, 333 (1990).
27. F. Laurell, M. G. Roefols, M. Bindloss, H. Hsuing, A. Suma, and J. D. Bierlein, J. Appl. Phys. 71, 4664 (1992).
28. M. T. Sebastian, H. Klapper, and R. J. Bolt, J. Appl. Crystallogr. 25, 274 (1992).
29. P. A. Thomas and A. M. Glazer, J. Appl. Crystallogr. 24, 968 (1991).
30. G. M. Loiacono, D. N. Loiacono, and R. A. Stolzenberg, J. Cryst. Growth 144, 223 (1994).
31. I. M. Sil'vestrova, Y. V. Pisarevskii, V. I. Voronkova, and V. K. Yanovskii, Sov. Phys. Crystallogr. 35, 140 (1990).
32. I. M. Sil'vestrova, V. A. Maslov, and Y. V. Pisarevskii, Sov. Phys. Crystallogr. 37, 660 (1992).
33. K. Franke and M. Weihnacht, Ferroelectr. Lett. Sect. 19, 25 (1995).
34. K. Franke, Ferroelectr. Lett. Sect. 19, 35 (1995).
35. Please note that due to the design asymmetry of the cantilever, cantilever torsion along the x axes is impossible to be recorded with the simple setup shown in Fig. 1 (see also Ref. 17).
36. Here we consider the permittivity of both RTP and KTP to be approximately equal which is fulfilled experimentally.