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Volumn 71, Issue 7, 1999, Pages 1337-1357

Classification of scanning probe microscopies (Technical Report)

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EID: 18944378184     PISSN: 00334545     EISSN: 13653075     Source Type: Journal    
DOI: 10.1351/pac199971071337     Document Type: Article
Times cited : (59)

References (118)
  • 2
    • 60049098657 scopus 로고
    • Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung
    • E. Abbe. Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung. Arch. Mikrosk. Anat. 9, 413–468 (1873).
    • (1873) Arch. Mikrosk. Anat. , vol.9 , pp. 413-468
    • Abbe, E.1
  • 3
    • 0000644028 scopus 로고
    • A suggested method for extending microscopic resolution into the ultra-microscopic region
    • E. H. Synge. A suggested method for extending microscopic resolution into the ultra-microscopic region. Phil. Mag. 6, 356–362 (1928).
    • (1928) Phil. Mag. , vol.6 , pp. 356-362
    • Synge, E.H.1
  • 4
    • 0001492895 scopus 로고
    • Resolving power of visible light
    • J. A. O'Keefe. Resolving power of visible light. J. Opt. Soc. Am. 46, 359 (1956).
    • (1956) J. Opt. Soc. Am. , vol.46 , pp. 359
    • O'Keefe, J.A.1
  • 5
    • 0000704117 scopus 로고
    • The topografiner: an instrument for measuring surface microtopography
    • R. Young, J. Ward, F. Scire. The topografiner: an instrument for measuring surface microtopography. Rev. Sci. Instrum. 43, 999–1011 (1972).
    • (1972) Rev. Sci. Instrum. , vol.43 , pp. 999-1011
    • Young, R.1    Ward, J.2    Scire, F.3
  • 7
    • 0002530677 scopus 로고
    • Atomic structure of ordered copper adlayers on single-crystalline gold electrodes
    • O. M. Magnussen, J. Hotlos, G. Beitel, D. M. Kolb, R. J. Behm. Atomic structure of ordered copper adlayers on single-crystalline gold electrodes. J. Vac. Sci. Technol. B9, 969–975 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 969-975
    • Magnussen, O.M.1    Hotlos, J.2    Beitel, G.3    Kolb, D.M.4    Behm, R.J.5
  • 8
    • 0000985809 scopus 로고
    • Atom-selective imaging of the gallium arsenide(110) surface
    • R. M. Feenstra, J. A. Stroscio, J. Tersoff, A. P. Fein. Atom-selective imaging of the gallium arsenide(110) surface. Phys. Rev. Lett. 58, 1192–1195 (1987).
    • (1987) Phys. Rev. Lett. , vol.58 , pp. 1192-1195
    • Feenstra, R.M.1    Stroscio, J.A.2    Tersoff, J.3    Fein, A.P.4
  • 9
    • 0344032575 scopus 로고
    • Atom-resolved surface chemistry using the scanning tunneling microscope
    • Ph. Avouris. Atom-resolved surface chemistry using the scanning tunneling microscope. J. Phys. Chem. 94, 2246–2256 (1990).
    • (1990) J. Phys. Chem. , vol.94 , pp. 2246-2256
    • Avouris, P.1
  • 10
    • 0000578209 scopus 로고
    • Atom-resolved surface chemistry: The early steps of Si(111)−7×7 oxidation
    • Ph. Avouris, I. W. Lyo, F. Bozso. Atom-resolved surface chemistry: The early steps of Si(111)−7×7 oxidation. J. Vac. Sci. Technol. B9, 424–430 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 424-430
    • Avouris, P.1    Lyo, I.W.2    Bozso, F.3
  • 11
    • 18944376512 scopus 로고
    • Probing and inducing surface chemistry on the atomic scale using the STM
    • Ph. Avouris, I.-W. Lyo. Probing and inducing surface chemistry on the atomic scale using the STM. AIP Conf Proceedings 241, 283–297 (1992).
    • (1992) AIP Conf Proceedings , vol.241 , pp. 283-297
    • Avouris, P.1    Lyo, I.-W.2
  • 12
    • 0009777236 scopus 로고
    • Noise in vacuum tunneling: application for a novel scanning microscope
    • R. Möller, A. Esslinger, B. Koslowski. Noise in vacuum tunneling: application for a novel scanning microscope. Appl. Phys. Lett. 55, 2360–2362 (1989).
    • (1989) Appl. Phys. Lett. , vol.55 , pp. 2360-2362
    • Möller, R.1    Esslinger, A.2    Koslowski, B.3
  • 13
    • 0012411029 scopus 로고
    • Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage
    • R. Möller, A. Esslinger, B. Koslowski. Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage. J. Vac. Sci. Technol. A8, 590–593 (1990).
    • (1990) J. Vac. Sci. Technol. , vol.A8 , pp. 590-593
    • Möller, R.1    Esslinger, A.2    Koslowski, B.3
  • 15
    • 0343007113 scopus 로고
    • Nonlinear alternating-current tunneling microscopy
    • G. P. Kochanski. Nonlinear alternating-current tunneling microscopy. Phys. Rev. Lett. 62, 2285–2288 (1989).
    • (1989) Phys. Rev. Lett. , vol.62 , pp. 2285-2288
    • Kochanski, G.P.1
  • 16
    • 0343973599 scopus 로고
    • Scanning chemical potential microscope: a new technique for atomic scale surface investigation
    • C. C. Williams, H. K. Wickramasinghe. Scanning chemical potential microscope: a new technique for atomic scale surface investigation. J. Vac. Sci. Technol. B9, 537–540 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 537-540
    • Williams, C.C.1    Wickramasinghe, H.K.2
  • 17
    • 0024799251 scopus 로고
    • Optical absorption microscopy and spectroscopy with nanometer resolution
    • J. M. R. Weaver, L. M. Walpita, H. K. Wickramasinghe. Optical absorption microscopy and spectroscopy with nanometer resolution. Nature 342, 783–785 (1989).
    • (1989) Nature , vol.342 , pp. 783-785
    • Weaver, J.M.R.1    Walpita, L.M.2    Wickramasinghe, H.K.3
  • 18
    • 84953658794 scopus 로고
    • Surface magnetism of epitaxial thin films by polarized electron scattering
    • S. F. Alvarado. Surface magnetism of epitaxial thin films by polarized electron scattering. J. Appl. Phys. 64, 5931 (1988).
    • (1988) J. Appl. Phys. , vol.64 , pp. 5931
    • Alvarado, S.F.1
  • 19
    • 4143083350 scopus 로고
    • Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope
    • R. Wiesendanger, H.-J. Güntherodt, G. Güntherodt, R. J. Gambino, R. Ruf. Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope. Phys. Rev. Lett. 65, 247–250 (1990).
    • (1990) Phys. Rev. Lett. , vol.65 , pp. 247-250
    • Wiesendanger, R.1    Güntherodt, H.-J.2    Güntherodt, G.3    Gambino, R.J.4    Ruf, R.5
  • 22
    • 0001021231 scopus 로고
    • Observation of spin-polarized-electron tunneling from a ferromagnet into gallium arsenide
    • S. F. Alvarado, P. Renaud. Observation of spin-polarized-electron tunneling from a ferromagnet into gallium arsenide. Phys. Rev. Lett. 68, 1387–1390 (1992).
    • (1992) Phys. Rev. Lett. , vol.68 , pp. 1387-1390
    • Alvarado, S.F.1    Renaud, P.2
  • 23
    • 0006587647 scopus 로고
    • Spin polarized electron tunneling from a ferromagnet into GaAs(110)
    • S. F. Alvarado. Spin polarized electron tunneling from a ferromagnet into GaAs(110). J. Appl. Phys. 73, 5816 (1993).
    • (1993) J. Appl. Phys. , vol.73 , pp. 5816
    • Alvarado, S.F.1
  • 24
    • 0001158420 scopus 로고
    • Tunneling potential barrier dependence of electron spin polarization
    • S. F. Alvarado. Tunneling potential barrier dependence of electron spin polarization. Phys. Rev. Lett. 75, 513–516 (1995).
    • (1995) Phys. Rev. Lett. , vol.75 , pp. 513-516
    • Alvarado, S.F.1
  • 25
    • 0000392344 scopus 로고
    • Direct investigation of subsurface interface electronic structure by ballistic electron emission microscopy
    • W. J. Kaiser, L. D. Bell. Direct investigation of subsurface interface electronic structure by ballistic electron emission microscopy. Phys. Rev. Lett. 60, 1406–1409 (1988).
    • (1988) Phys. Rev. Lett. , vol.60 , pp. 1406-1409
    • Kaiser, W.J.1    Bell, L.D.2
  • 26
    • 17244365811 scopus 로고
    • Observation of interface band structure by ballistic-electron-emission microscopy
    • L. D. Bell, W. J. Kaiser. Observation of interface band structure by ballistic-electron-emission microscopy. Phys. Rev. Lett. 61, 2368–2371 (1988).
    • (1988) Phys. Rev. Lett. , vol.61 , pp. 2368-2371
    • Bell, L.D.1    Kaiser, W.J.2
  • 27
  • 29
    • 0006872819 scopus 로고
    • Photovoltage on silicon surfaces measured by scanning tunneling microscopy
    • Y. Kuk, R. S. Becker, P. J. Silverman, G. P. Kochanski. Photovoltage on silicon surfaces measured by scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 545–550 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 545-550
    • Kuk, Y.1    Becker, R.S.2    Silverman, P.J.3    Kochanski, G.P.4
  • 30
    • 0010801791 scopus 로고
    • Tunneling spectroscopy analysis of optically active wide band-gap semiconductors
    • D. A. Bonnell, G. S. Rohrer, R. H. French. Tunneling spectroscopy analysis of optically active wide band-gap semiconductors. J. Vac. Sci. Technol. B9, 551–556 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 551-556
    • Bonnell, D.A.1    Rohrer, G.S.2    French, R.H.3
  • 31
    • 0000596506 scopus 로고
    • Prism-coupled light emission from a scanning tunneling microscope
    • K. Takeuchi, Y. Uehara, S. Ushioda, S. Morita. Prism-coupled light emission from a scanning tunneling microscope. J. Vac. Sci. Technol. B9, 557–560 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 557-560
    • Takeuchi, K.1    Uehara, Y.2    Ushioda, S.3    Morita, S.4
  • 33
    • 0001178778 scopus 로고
    • Scanning tunneling microscopy of photoexcited carriers at the silicon(100) surface
    • D. G. Cahill, R. J. Hamers. Scanning tunneling microscopy of photoexcited carriers at the silicon(100) surface. J. Vac. Sci. Technol. B9, 564–567 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 564-567
    • Cahill, D.G.1    Hamers, R.J.2
  • 34
    • 0004964036 scopus 로고
    • Analysis and compensation of thermal effects in laser-assisted scanning tunneling microscopy
    • S. Grafström, J. Kowalski, R. Neumann, O. Probst, M. Wörtge. Analysis and compensation of thermal effects in laser-assisted scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 568–572 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 568-572
    • Grafström, S.1    Kowalski, J.2    Neumann, R.3    Probst, O.4    Wörtge, M.5
  • 37
    • 0026896888 scopus 로고
    • Observation of local photoemission using a scanning tunneling microscope
    • J. K. Gimzewski, R. Berndt, R. R. Schlittler. Observation of local photoemission using a scanning tunneling microscope. Ultramicroscopy 42–44, 366–370 (1992).
    • (1992) Ultramicroscopy , pp. 366-370
    • Gimzewski, J.K.1    Berndt, R.2    Schlittler, R.R.3
  • 38
    • 0026896975 scopus 로고
    • Microscopic theory of light emission from the scanning tunneling microscope
    • M. Tsukada, T. Schimizu, K. Kobayashi. Microscopic theory of light emission from the scanning tunneling microscope. Ultramicroscopy 42–44, 360–365 (1992).
    • (1992) Ultramicroscopy , pp. 360-365
    • Tsukada, M.1    Schimizu, T.2    Kobayashi, K.3
  • 45
    • 0002950715 scopus 로고
    • Scanning attractive force microscope using photothermal vibration
    • N. Umeda, S. Ishizaki, H. Uwai. Scanning attractive force microscope using photothermal vibration. J. Vac. Sci. Technol. B9, 1318–1322 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1318-1322
    • Umeda, N.1    Ishizaki, S.2    Uwai, H.3
  • 47
    • 11944250146 scopus 로고
    • Atomic Force Microscopy
    • D. Rugar, P. Hansma. Atomic Force Microscopy. Phys. Today 43, 23–30 (1990).
    • (1990) Phys. Today , vol.43 , pp. 23-30
    • Rugar, D.1    Hansma, P.2
  • 48
    • 33745986903 scopus 로고
    • Surface characterization of materials at ambient conditions by scanning tunneling microscopy (STM) and atomic force microscopy (AFM)
    • S. N. Magonov. Surface characterization of materials at ambient conditions by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Appl. Spectrosc. Rev. 28, 1–121 (1993).
    • (1993) Appl. Spectrosc. Rev. , vol.28 , pp. 1-121
    • Magonov, S.N.1
  • 49
    • 0001016149 scopus 로고
    • Scanning tunneling and atomic force microscopy in organic chemistry
    • J. Frommer. Scanning tunneling and atomic force microscopy in organic chemistry. Angew. Chem. 104, 1325–1357 (1992).
    • (1992) Angew. Chem. , vol.104 , pp. 1325-1357
    • Frommer, J.1
  • 50
    • 0006810309 scopus 로고
    • Atomic force and scanning tunneling microscopy of organic surfaces
    • H. Fuchs. Atomic force and scanning tunneling microscopy of organic surfaces. J. Mol. Struct. 292, 29–47 (1993).
    • (1993) J. Mol. Struct. , vol.292 , pp. 29-47
    • Fuchs, H.1
  • 51
    • 0000994148 scopus 로고
    • Surface analysis with atomic force microscopy through measurement in air and under liquids
    • G. Friedbacher, T. Prohaska, M. Grasserbauer. Surface analysis with atomic force microscopy through measurement in air and under liquids. Mikrochim. Acta 113, 179–202 (1994).
    • (1994) Mikrochim. Acta , vol.113 , pp. 179-202
    • Friedbacher, G.1    Prohaska, T.2    Grasserbauer, M.3
  • 53
    • 0039661802 scopus 로고
    • Optical-beam-deflection atomic force microscopy: The sodium chloride(001) surface
    • G. Meyer, N. M. Amer. Optical-beam-deflection atomic force microscopy: The sodium chloride(001) surface. Appl. Phys. Lett. 53, 2400–2401 (1988).
    • (1988) Appl. Phys. Lett. , vol.53 , pp. 2400-2401
    • Meyer, G.1    Amer, N.M.2
  • 54
    • 77952760920 scopus 로고
    • Microfabrication of cantilever styli for the atomic force microscope
    • T. R. Albrecht, S. Akamine, T. E. Carver, C. F. Quate. Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A8, 3386–3396 (1990).
    • (1990) J. Vac. Sci. Technol. , vol.A8 , pp. 3386-3396
    • Albrecht, T.R.1    Akamine, S.2    Carver, T.E.3    Quate, C.F.4
  • 55
    • 84881605956 scopus 로고
    • Micromachined silicon sensors for scanning force microscopy
    • O. Wolter, Th. Bayer, J. Greschner. Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B9, 1353–1357 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1353-1357
    • Wolter, O.1    Bayer, T.2    Greschner, J.3
  • 56
    • 0346891488 scopus 로고
    • Insitu investigation of aluminum gallium arsenide/gallium arsenide multilayer structures under inert and reactive media by atomic force microscopy
    • T. Prohaska, G. Friedbacher, M. Grasserbauer, H. Nickel, R. Lösch, W. Schlapp. Insitu investigation of aluminum gallium arsenide/gallium arsenide multilayer structures under inert and reactive media by atomic force microscopy. Anal. Chem. 67, 1530–1535 (1995).
    • (1995) Anal. Chem. , vol.67 , pp. 1530-1535
    • Prohaska, T.1    Friedbacher, G.2    Grasserbauer, M.3    Nickel, H.4    Lösch, R.5    Schlapp, W.6
  • 57
    • 0029207025 scopus 로고
    • Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy
    • I. Schmitz, T. Prohaska, G. Friedbacher, M. Schreiner, M. Grasserbauer. Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy. Fresenius J. Anal. Chem. 353, 666–669 (1995).
    • (1995) Fresenius J. Anal. Chem. , vol.353 , pp. 666-669
    • Schmitz, I.1    Prohaska, T.2    Friedbacher, G.3    Schreiner, M.4    Grasserbauer, M.5
  • 58
    • 84874953797 scopus 로고
    • Atomic-scale imaging of calcite growth and dissolution in real time
    • P. E. Hillner, A. J. Gratz, S. Manne, P. K. Hansma. Atomic-scale imaging of calcite growth and dissolution in real time. Geology 20, 359–362 (1992).
    • (1992) Geology , vol.20 , pp. 359-362
    • Hillner, P.E.1    Gratz, A.J.2    Manne, S.3    Hansma, P.K.4
  • 59
    • 0026035212 scopus 로고
    • Atomic-resolution electrochemistry with the atomic force microscope: Copper deposition on gold
    • S. Manne, P. K. Hansma, J. Massie, V. B. Elings, A. A. Gewirth. Atomic-resolution electrochemistry with the atomic force microscope: Copper deposition on gold. Science 251, 183–186 (1991).
    • (1991) Science , vol.251 , pp. 183-186
    • Manne, S.1    Hansma, P.K.2    Massie, J.3    Elings, V.B.4    Gewirth, A.A.5
  • 60
    • 0347829297 scopus 로고
    • Atomic resolution electrochemistry of underpotential deposition processes
    • A. A. Gewirth. Atomic resolution electrochemistry of underpotential deposition processes. AIP Conf Proceedings 241, 253–261 (1992).
    • (1992) AIP Conf Proceedings , vol.241 , pp. 253-261
    • Gewirth, A.A.1
  • 61
    • 0343681011 scopus 로고
    • Atomic-scale friction of a tungsten tip on a graphite surface
    • C. M. Mate, G. M. McClelland, R. Erlandsson, S. Chiang. Atomic-scale friction of a tungsten tip on a graphite surface. Phys. Rev. Lett. 59, 1942–1945 (1987).
    • (1987) Phys. Rev. Lett. , vol.59 , pp. 1942-1945
    • Mate, C.M.1    McClelland, G.M.2    Erlandsson, R.3    Chiang, S.4
  • 62
    • 0001384474 scopus 로고
    • Tribological characteristics of amorphous carbon films investigated by point contact microscopy
    • T. Miyamoto, R. Kaneko, S. Miyake. Tribological characteristics of amorphous carbon films investigated by point contact microscopy. J. Vac. Sci. Technol. B9, 1336–1339 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1336-1339
    • Miyamoto, T.1    Kaneko, R.2    Miyake, S.3
  • 63
    • 0037975349 scopus 로고
    • Sliding friction measurements of physisorbed monolayers: a comparison of solid and liquid films
    • J. Krim, R. Chiarello. Sliding friction measurements of physisorbed monolayers: a comparison of solid and liquid films. J. Vac. Sci. Technol. B9, 1343–1346 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1343-1346
    • Krim, J.1    Chiarello, R.2
  • 67
    • 84927762517 scopus 로고
    • Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
    • N. A. Burnham, R. J. Colton. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J. Vac. Sci. Technol. A7, 2906–2913 (1989).
    • (1989) J. Vac. Sci. Technol. , vol.A7 , pp. 2906-2913
    • Burnham, N.A.1    Colton, R.J.2
  • 68
    • 0000294382 scopus 로고
    • Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass
    • J. H. Hoh, J.-P. Revel, P. K. Hansma. Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology 2, 119–122 (1991).
    • (1991) Nanotechnology , vol.2 , pp. 119-122
    • Hoh, J.H.1    Revel, J.-P.2    Hansma, P.K.3
  • 69
    • 0000383748 scopus 로고
    • Electrostatic and contact forces in force microscopy
    • H. W. Hao, A. M. Baró, J.J.Sáenz. Electrostatic and contact forces in force microscopy. J. Vac. Sci. Technol. B9, 1323–1328 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 1323-1328
    • Hao, H.W.1    Baró, A.M.2
  • 70
    • 0000561825 scopus 로고
    • Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities
    • H. A. Mizes, K.-G. Loh, R. J. D. Miller, S. K. Ahuja, E. F. Grabowski. Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities. Appl. Phys. Lett. 59, 2901–2903 (1991).
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 2901-2903
    • Mizes, H.A.1    Loh, K.-G.2    Miller, R.J.D.3    Ahuja, S.K.4    Grabowski, E.F.5
  • 71
    • 0026038548 scopus 로고
    • Electrostatic interaction in atomic force microscopy
    • H.-J. Butt. Electrostatic interaction in atomic force microscopy. Biophys. J. 60, 777–785 (1991).
    • (1991) Biophys. J. , vol.60 , pp. 777-785
    • Butt, H.-J.1
  • 72
    • 0000746799 scopus 로고
    • Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic force microscope
    • A. L. Weisenhorn, P. Maivald, H.-J. Butt, P. K. Hansma. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic force microscope. Phys. Rev. B 45, 11226–11232 (1992).
    • (1992) Phys. Rev. B , vol.45 , pp. 11226-11232
    • Weisenhorn, A.L.1    Maivald, P.2    Butt, H.-J.3    Hansma, P.K.4
  • 73
    • 0026896658 scopus 로고
    • Measurement of forces in liquids using a force microscope
    • W. A. Ducker, T. J. Senden, R. M. Pashley. Measurement of forces in liquids using a force microscope. Langmuir 8, 1831–1836 (1992).
    • (1992) Langmuir , vol.8 , pp. 1831-1836
    • Ducker, W.A.1    Senden, T.J.2    Pashley, R.M.3
  • 75
    • 0141547797 scopus 로고
    • Characterization of surface energetic behavior by atomic force microscopy
    • A. Kawai, H. Nagata, M. Takata. Characterization of surface energetic behavior by atomic force microscopy. Jpn. J. Appl. Phys. 31, L977–L979 (1992).
    • (1992) Jpn. J. Appl. Phys. , vol.31 , pp. L977-L979
    • Kawai, A.1    Nagata, H.2    Takata, M.3
  • 76
    • 0001353845 scopus 로고
    • Friction effects on force measurements with an atomic force microscope
    • J. H. Hoh, A. Engel. Friction effects on force measurements with an atomic force microscope. Langmuir 9, 3310–3312 (1993).
    • (1993) Langmuir , vol.9 , pp. 3310-3312
    • Hoh, J.H.1    Engel, A.2
  • 77
    • 0001551895 scopus 로고    scopus 로고
    • Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
    • B. Anczykowski, D. Krüger, H. Fuchs. Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. Phys. Rev. B 53, 15485–15488 (1996).
    • (1996) Phys. Rev. B , vol.53 , pp. 15485-15488
    • Anczykowski, B.1    Krüger, D.2    Fuchs, H.3
  • 78
    • 0030435432 scopus 로고    scopus 로고
    • Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment an simulation
    • B. Anczykowski, D. Krüger, K. L. Babcock, H. Fuchs. Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment an simulation. Ultramicroscopy 66, 251–259 (1996).
    • (1996) Ultramicroscopy , vol.66 , pp. 251-259
    • Anczykowski, B.1    Krüger, D.2    Babcock, K.L.3    Fuchs, H.4
  • 79
    • 0030678858 scopus 로고    scopus 로고
    • Physical properties of dynamic force microscopies in contact and noncontact operation
    • D. Krüger, B. Anczykowski, H. Fuchs. Physical properties of dynamic force microscopies in contact and noncontact operation. Ann. Phys. 6, 341–363 (1997).
    • (1997) Ann. Phys. , vol.6 , pp. 341-363
    • Krüger, D.1    Anczykowski, B.2    Fuchs, H.3
  • 80
    • 0027610690 scopus 로고
    • Fractured polymer/silica fiber surface studied by tapping mode atomic force microscope
    • Q. Zhong, D. Inniss, K. Kjoller, V. B. Elings. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscope. Surf. Sci. Lett. 290, L688–L692 (1993).
    • (1993) Surf. Sci. Lett. , vol.290 , pp. L688-L692
    • Zhong, Q.1    Inniss, D.2    Kjoller, K.3    Elings, V.B.4
  • 81
    • 0027694906 scopus 로고
    • High resolution imaging of cell surface using a tapping-mode atomic force microscopy
    • K. Umemura, H. Arakawa, A. Ikai. High resolution imaging of cell surface using a tapping-mode atomic force microscopy. Jpn. J. Appl. Phys. Part 2 11B, L1711–L1714 (1993).
    • (1993) Jpn. J. Appl. Phys. , vol.11 B , pp. L1711-L1714
    • Umemura, K.1    Arakawa, H.2    Ikai, A.3
  • 84
    • 0001378004 scopus 로고
    • Imaging of cells with atomic force microscopy at a tapping mode
    • T. Shibata-Seki, W. Watanabe, J. Masai. Imaging of cells with atomic force microscopy at a tapping mode. J. Vac. Sci. Technol. B12, 1530–1534 (1994).
    • (1994) J. Vac. Sci. Technol. , vol.B12 , pp. 1530-1534
    • Shibata-Seki, T.1    Watanabe, W.2    Masai, J.3
  • 85
    • 0028100908 scopus 로고
    • Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy
    • C. A. J. Putman, K. O. van der Werf, B. G. de Grooth, N. F. van Hulst, J. Greve. Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy. Biophys. J. 67, 1749–1753 (1994).
    • (1994) Biophys. J. , vol.67 , pp. 1749-1753
    • Putman, C.A.J.1    van der Werf, K.O.2    de Grooth, B.G.3    van Hulst, N.F.4    Greve, J.5
  • 87
    • 33750306098 scopus 로고
    • Atomic force microscope—force mapping and profiling on a sub 100–Å scale
    • Y. Martin, C. C. Williams, H. K. Wickramasinghe. Atomic force microscope—force mapping and profiling on a sub 100–Å scale. J. Appl. Phys. 61, 4723–4729 (1987).
    • (1987) J. Appl. Phys. , vol.61 , pp. 4723-4729
    • Martin, Y.1    Williams, C.C.2    Wickramasinghe, H.K.3
  • 88
    • 0348175886 scopus 로고
    • Deposition and imaging of localized charge on insulator surfaces using a force microscope
    • J. E. Stern, B. D. Terris, H. J. Mamin, D. Rugar. Deposition and imaging of localized charge on insulator surfaces using a force microscope. Appl. Phys. Lett. 53, 2717–2719 (1988).
    • (1988) Appl. Phys. Lett. , vol.53 , pp. 2717-2719
    • Stern, J.E.1    Terris, B.D.2    Mamin, H.J.3    Rugar, D.4
  • 90
    • 0000657908 scopus 로고
    • Structural study of Langmuir–Blodgett films by scanning surface potential microscopy
    • M. Fujihira, H. Kawate. Structural study of Langmuir–Blodgett films by scanning surface potential microscopy. J. Vac. Sci. Technol. B12, 1604–1608 (1994).
    • (1994) J. Vac. Sci. Technol. , vol.B12 , pp. 1604-1608
    • Fujihira, M.1    Kawate, H.2
  • 91
    • 0026896885 scopus 로고
    • Surface investigations with a Kelvin probe force microscope
    • M. Nonnenmacher, M. O'Boyle, H. K. Wickramasinghe. Surface investigations with a Kelvin probe force microscope. Ultramicroscopy 42–44, 268–273 (1992).
    • (1992) Ultramicroscopy , vol.42-44 , pp. 268-273
    • Nonnenmacher, M.1    O'Boyle, M.2    Wickramasinghe, H.K.3
  • 93
    • 4244085510 scopus 로고
    • Magnetic imaging by ‘force microscopy’ with 1000 A resolution
    • Y. Martin, H. K. Wickramasinghe. Magnetic imaging by ‘force microscopy’ with 1000 A resolution. Appl. Phys. Lett. 50, 1455–1457 (1987).
    • (1987) Appl. Phys. Lett. , vol.50 , pp. 1455-1457
    • Martin, Y.1    Wickramasinghe, H.K.2
  • 94
    • 0026896970 scopus 로고
    • Applications of magnetic force microscopy in magnetic storage device manufacturing
    • G. Persch, H. Strecker. Applications of magnetic force microscopy in magnetic storage device manufacturing. Ultramicroscopy 42–44, 1269–1274 (1992).
    • (1992) Ultramicroscopy , vol.42-44 , pp. 1269-1274
    • Persch, G.1    Strecker, H.2
  • 95
    • 0000661712 scopus 로고
    • Theory of Van der Waals microscopy
    • U. Hartmann. Theory of Van der Waals microscopy. J. Vac. Sci. Technol. B9, 465–469 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 465-469
    • Hartmann, U.1
  • 96
    • 0013357990 scopus 로고
    • Near-field optics: Light for the world of NANO
    • D. W. Pohl, L. Novotny. Near-field optics: Light for the world of NANO. J. Vac. Sci. Technol. B12, 1441–1446 (1994).
    • (1994) J. Vac. Sci. Technol. , vol.B12 , pp. 1441-1446
    • Pohl, D.W.1    Novotny, L.2
  • 98
    • 5544268684 scopus 로고
    • Photon scanning tunneling microscopy
    • R. C. Reddick. Photon scanning tunneling microscopy. AIP Conf Proceedings 241, 37–50 (1992).
    • (1992) AIP Conf Proceedings , vol.241 , pp. 37-50
    • Reddick, R.C.1
  • 99
    • 0028607173 scopus 로고
    • The tetrahedral tip as a probe for scanning near-field optical microscopy at 30 nm resolution
    • U. C. Fischer, J. Koglin, H. Fuchs. The tetrahedral tip as a probe for scanning near-field optical microscopy at 30 nm resolution. J. Microscopy. 176, 231–237 (1994).
    • (1994) J. Microscopy. , vol.176 , pp. 231-237
    • Fischer, U.C.1    Koglin, J.2    Fuchs, H.3
  • 100
    • 0001542161 scopus 로고    scopus 로고
    • Material contrast in scanning near-field optical microscopy at 1–10 nm resolution
    • J. Koglin, U. C. Fischer, H. Fuchs. Material contrast in scanning near-field optical microscopy at 1–10 nm resolution. Phys. Rev. B 55, 7977–7984 (1997).
    • (1997) Phys. Rev. B , vol.55 , pp. 7977-7984
    • Koglin, J.1    Fischer, U.C.2    Fuchs, H.3
  • 102
    • 0026899438 scopus 로고
    • Progress in photon scanning tunneling microscopy (PSTM)
    • T. L. Ferrell, S. L. Sharp, R. J. Warmack. Progress in photon scanning tunneling microscopy (PSTM). Ultramicroscopy 42–44, 408–415 (1992).
    • (1992) Ultramicroscopy , pp. 408-415
    • Ferrell, T.L.1    Sharp, S.L.2    Warmack, R.J.3
  • 103
    • 0026898276 scopus 로고
    • Evanescent-field optical microscopy: Effects of polarization, tip shape, and radiative waves
    • N. F. van Hulst, F. B. Segerink, F. Achten, B. Bögler. Evanescent-field optical microscopy: Effects of polarization, tip shape, and radiative waves. Ultramicroscopy 42–44, 416–421 (1992).
    • (1992) Ultramicroscopy , vol.42-44 , pp. 416-421
    • van Hulst, N.F.1    Segerink, F.B.2    Achten, F.3    Bögler, B.4
  • 104
    • 0042189262 scopus 로고
    • Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope
    • P. J. Moyer, C. L. Jahncke, M. A. Paesler, R. C. Reddick, R. J. Warmack. Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope. Phys. Lett. A 145, 343–347 (1990).
    • (1990) Phys. Lett. A , vol.145 , pp. 343-347
    • Moyer, P.J.1    Jahncke, C.L.2    Paesler, M.A.3    Reddick, R.C.4    Warmack, R.J.5
  • 109
    • 0025954563 scopus 로고
    • Chemical imaging of surfaces with the scanning electrochemical microscope
    • A. J. Bard, F.-R.F. Fan, D. T. Pierce, P. R. Unwin, D. O. Wipf, F. Zhou. Chemical imaging of surfaces with the scanning electrochemical microscope. Science 254, 68–74 (1991).
    • (1991) Science , vol.254 , pp. 68-74
    • Bard, A.J.1    Fan, F.-R.F.2    Pierce, D.T.3    Unwin, P.R.4    Wipf, D.O.5    Zhou, F.6
  • 110
    • 0037867862 scopus 로고
    • Scanning capacitance microscopy
    • J. R. Matey, J. Blanc. Scanning capacitance microscopy. J. Appl. Phys. 57, 1437–1444 (1985).
    • (1985) J. Appl. Phys. , vol.57 , pp. 1437-1444
    • Matey, J.R.1    Blanc, J.2
  • 111
    • 36549094573 scopus 로고
    • Scanning capacitance microscopy on a 35 nm scale
    • C. C. Williams, W. P. Hough, S. A. Rishton. Scanning capacitance microscopy on a 35 nm scale. Appl. Phys. Lett. 55, 203–205 (1989).
    • (1989) Appl. Phys. Lett. , vol.55 , pp. 203-205
    • Williams, C.C.1    Hough, W.P.2    Rishton, S.A.3
  • 112
    • 36449009560 scopus 로고
    • Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy
    • R. C. Barrett, C. F. Quate. Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy. J. Appl. Phys. 70, 2725–2733 (1991).
    • (1991) J. Appl. Phys. , vol.70 , pp. 2725-2733
    • Barrett, R.C.1    Quate, C.F.2
  • 113
    • 0001680985 scopus 로고
    • Lateral dopant profiling in semiconductors by force microscopy using capacitive detection
    • D. W. Abraham, C. Williams, J. Slinkman, H. K. Wickramasinghe. Lateral dopant profiling in semiconductors by force microscopy using capacitive detection. J. Vac. Sci. Technol. B9, 703–706 (1991).
    • (1991) J. Vac. Sci. Technol. , vol.B9 , pp. 703-706
    • Abraham, D.W.1    Williams, C.2    Slinkman, J.3    Wickramasinghe, H.K.4
  • 115
    • 21544432308 scopus 로고
    • Improved scanning ion-conductance microscope using microfabricated probes
    • C. B. Prater, P. K. Hansma, M. Tortonese, C. F. Quate. Improved scanning ion-conductance microscope using microfabricated probes. Rev. Sci. Instrum. 62, 2634–2638 (1991).
    • (1991) Rev. Sci. Instrum. , vol.62 , pp. 2634-2638
    • Prater, C.B.1    Hansma, P.K.2    Tortonese, M.3    Quate, C.F.4


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