-
1
-
-
34848919386
-
Surface studies by scanning tunneling microscopy
-
G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel. Surface studies by scanning tunneling microscopy. Phys. Rev. Lett. 49, 57–61 (1982).
-
(1982)
Phys. Rev. Lett.
, vol.49
, pp. 57-61
-
-
Binnig, G.1
Rohrer, H.2
Gerber, C.3
Weibel, E.4
-
2
-
-
60049098657
-
Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung
-
E. Abbe. Beiträge zur Theorie des Mikroskops und der mikroskopischen Wahrnehmung. Arch. Mikrosk. Anat. 9, 413–468 (1873).
-
(1873)
Arch. Mikrosk. Anat.
, vol.9
, pp. 413-468
-
-
Abbe, E.1
-
3
-
-
0000644028
-
A suggested method for extending microscopic resolution into the ultra-microscopic region
-
E. H. Synge. A suggested method for extending microscopic resolution into the ultra-microscopic region. Phil. Mag. 6, 356–362 (1928).
-
(1928)
Phil. Mag.
, vol.6
, pp. 356-362
-
-
Synge, E.H.1
-
4
-
-
0001492895
-
Resolving power of visible light
-
J. A. O'Keefe. Resolving power of visible light. J. Opt. Soc. Am. 46, 359 (1956).
-
(1956)
J. Opt. Soc. Am.
, vol.46
, pp. 359
-
-
O'Keefe, J.A.1
-
5
-
-
0000704117
-
The topografiner: an instrument for measuring surface microtopography
-
R. Young, J. Ward, F. Scire. The topografiner: an instrument for measuring surface microtopography. Rev. Sci. Instrum. 43, 999–1011 (1972).
-
(1972)
Rev. Sci. Instrum.
, vol.43
, pp. 999-1011
-
-
Young, R.1
Ward, J.2
Scire, F.3
-
7
-
-
0002530677
-
Atomic structure of ordered copper adlayers on single-crystalline gold electrodes
-
O. M. Magnussen, J. Hotlos, G. Beitel, D. M. Kolb, R. J. Behm. Atomic structure of ordered copper adlayers on single-crystalline gold electrodes. J. Vac. Sci. Technol. B9, 969–975 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 969-975
-
-
Magnussen, O.M.1
Hotlos, J.2
Beitel, G.3
Kolb, D.M.4
Behm, R.J.5
-
8
-
-
0000985809
-
Atom-selective imaging of the gallium arsenide(110) surface
-
R. M. Feenstra, J. A. Stroscio, J. Tersoff, A. P. Fein. Atom-selective imaging of the gallium arsenide(110) surface. Phys. Rev. Lett. 58, 1192–1195 (1987).
-
(1987)
Phys. Rev. Lett.
, vol.58
, pp. 1192-1195
-
-
Feenstra, R.M.1
Stroscio, J.A.2
Tersoff, J.3
Fein, A.P.4
-
9
-
-
0344032575
-
Atom-resolved surface chemistry using the scanning tunneling microscope
-
Ph. Avouris. Atom-resolved surface chemistry using the scanning tunneling microscope. J. Phys. Chem. 94, 2246–2256 (1990).
-
(1990)
J. Phys. Chem.
, vol.94
, pp. 2246-2256
-
-
Avouris, P.1
-
10
-
-
0000578209
-
Atom-resolved surface chemistry: The early steps of Si(111)−7×7 oxidation
-
Ph. Avouris, I. W. Lyo, F. Bozso. Atom-resolved surface chemistry: The early steps of Si(111)−7×7 oxidation. J. Vac. Sci. Technol. B9, 424–430 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 424-430
-
-
Avouris, P.1
Lyo, I.W.2
Bozso, F.3
-
11
-
-
18944376512
-
Probing and inducing surface chemistry on the atomic scale using the STM
-
Ph. Avouris, I.-W. Lyo. Probing and inducing surface chemistry on the atomic scale using the STM. AIP Conf Proceedings 241, 283–297 (1992).
-
(1992)
AIP Conf Proceedings
, vol.241
, pp. 283-297
-
-
Avouris, P.1
Lyo, I.-W.2
-
12
-
-
0009777236
-
Noise in vacuum tunneling: application for a novel scanning microscope
-
R. Möller, A. Esslinger, B. Koslowski. Noise in vacuum tunneling: application for a novel scanning microscope. Appl. Phys. Lett. 55, 2360–2362 (1989).
-
(1989)
Appl. Phys. Lett.
, vol.55
, pp. 2360-2362
-
-
Möller, R.1
Esslinger, A.2
Koslowski, B.3
-
13
-
-
0012411029
-
Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage
-
R. Möller, A. Esslinger, B. Koslowski. Thermal noise in vacuum scanning tunneling microscopy at zero bias voltage. J. Vac. Sci. Technol. A8, 590–593 (1990).
-
(1990)
J. Vac. Sci. Technol.
, vol.A8
, pp. 590-593
-
-
Möller, R.1
Esslinger, A.2
Koslowski, B.3
-
14
-
-
3943096903
-
Scanning noise potentiometry
-
R. Möller, C. Baur, A. Esslinger, P. Kürz. Scanning noise potentiometry. J. Vac. Sci. Technol. B9, 609–611 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 609-611
-
-
Möller, R.1
Baur, C.2
Esslinger, A.3
Kürz, P.4
-
15
-
-
0343007113
-
Nonlinear alternating-current tunneling microscopy
-
G. P. Kochanski. Nonlinear alternating-current tunneling microscopy. Phys. Rev. Lett. 62, 2285–2288 (1989).
-
(1989)
Phys. Rev. Lett.
, vol.62
, pp. 2285-2288
-
-
Kochanski, G.P.1
-
16
-
-
0343973599
-
Scanning chemical potential microscope: a new technique for atomic scale surface investigation
-
C. C. Williams, H. K. Wickramasinghe. Scanning chemical potential microscope: a new technique for atomic scale surface investigation. J. Vac. Sci. Technol. B9, 537–540 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 537-540
-
-
Williams, C.C.1
Wickramasinghe, H.K.2
-
17
-
-
0024799251
-
Optical absorption microscopy and spectroscopy with nanometer resolution
-
J. M. R. Weaver, L. M. Walpita, H. K. Wickramasinghe. Optical absorption microscopy and spectroscopy with nanometer resolution. Nature 342, 783–785 (1989).
-
(1989)
Nature
, vol.342
, pp. 783-785
-
-
Weaver, J.M.R.1
Walpita, L.M.2
Wickramasinghe, H.K.3
-
18
-
-
84953658794
-
Surface magnetism of epitaxial thin films by polarized electron scattering
-
S. F. Alvarado. Surface magnetism of epitaxial thin films by polarized electron scattering. J. Appl. Phys. 64, 5931 (1988).
-
(1988)
J. Appl. Phys.
, vol.64
, pp. 5931
-
-
Alvarado, S.F.1
-
19
-
-
4143083350
-
Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope
-
R. Wiesendanger, H.-J. Güntherodt, G. Güntherodt, R. J. Gambino, R. Ruf. Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope. Phys. Rev. Lett. 65, 247–250 (1990).
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 247-250
-
-
Wiesendanger, R.1
Güntherodt, H.-J.2
Güntherodt, G.3
Gambino, R.J.4
Ruf, R.5
-
20
-
-
85026015255
-
Tunneling of spin-polarized electrons
-
R. Wiesendanger, D. Bürgler, G. Tarrach, H.-J. Güntherodt, G. Güntherodt. Tunneling of spin-polarized electrons. AIP Conf Proceedings 241, 504ü510 (1992).
-
(1992)
AIP Conf Proceedings
, vol.241
, pp. 504-510
-
-
Wiesendanger, R.1
Bürgler, D.2
Tarrach, G.3
Güntherodt, H.-J.4
Güntherodt, G.5
-
21
-
-
0001327981
-
Vacuum tunneling of spin-polarized electrons detected by scanning tunneling microscopy
-
R. Wiesendanger, D. Bürgler, G. Tarrach, A. Wadas, D. Brodbeck, H.-J. Güntherodt, G. Güntherodt, R. J. Gambino, R. Ruf. Vacuum tunneling of spin-polarized electrons detected by scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 519–524 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 519-524
-
-
Wiesendanger, R.1
Bürgler, D.2
Tarrach, G.3
Wadas, A.4
Brodbeck, D.5
Güntherodt, H.-J.6
Güntherodt, G.7
Gambino, R.J.8
Ruf, R.9
-
22
-
-
0001021231
-
Observation of spin-polarized-electron tunneling from a ferromagnet into gallium arsenide
-
S. F. Alvarado, P. Renaud. Observation of spin-polarized-electron tunneling from a ferromagnet into gallium arsenide. Phys. Rev. Lett. 68, 1387–1390 (1992).
-
(1992)
Phys. Rev. Lett.
, vol.68
, pp. 1387-1390
-
-
Alvarado, S.F.1
Renaud, P.2
-
23
-
-
0006587647
-
Spin polarized electron tunneling from a ferromagnet into GaAs(110)
-
S. F. Alvarado. Spin polarized electron tunneling from a ferromagnet into GaAs(110). J. Appl. Phys. 73, 5816 (1993).
-
(1993)
J. Appl. Phys.
, vol.73
, pp. 5816
-
-
Alvarado, S.F.1
-
24
-
-
0001158420
-
Tunneling potential barrier dependence of electron spin polarization
-
S. F. Alvarado. Tunneling potential barrier dependence of electron spin polarization. Phys. Rev. Lett. 75, 513–516 (1995).
-
(1995)
Phys. Rev. Lett.
, vol.75
, pp. 513-516
-
-
Alvarado, S.F.1
-
25
-
-
0000392344
-
Direct investigation of subsurface interface electronic structure by ballistic electron emission microscopy
-
W. J. Kaiser, L. D. Bell. Direct investigation of subsurface interface electronic structure by ballistic electron emission microscopy. Phys. Rev. Lett. 60, 1406–1409 (1988).
-
(1988)
Phys. Rev. Lett.
, vol.60
, pp. 1406-1409
-
-
Kaiser, W.J.1
Bell, L.D.2
-
26
-
-
17244365811
-
Observation of interface band structure by ballistic-electron-emission microscopy
-
L. D. Bell, W. J. Kaiser. Observation of interface band structure by ballistic-electron-emission microscopy. Phys. Rev. Lett. 61, 2368–2371 (1988).
-
(1988)
Phys. Rev. Lett.
, vol.61
, pp. 2368-2371
-
-
Bell, L.D.1
Kaiser, W.J.2
-
27
-
-
34250091543
-
Photon emission with the scanning tunneling microscope
-
J. K. Gimzewski, B. Reihl, J. H. Coombs, R. R. Schlittler. Photon emission with the scanning tunneling microscope. Z. Phys. B 72, 497–501 (1988).
-
(1988)
Z. Phys. B
, vol.72
, pp. 497-501
-
-
Gimzewski, J.K.1
Reihl, B.2
Coombs, J.H.3
Schlittler, R.R.4
-
28
-
-
0006823430
-
Laser-assisted scanning tunneling microscopy
-
M. Völcker, W. Krieger, T. Suzuki, H. Walther. Laser-assisted scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 541–544 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 541-544
-
-
Völcker, M.1
Krieger, W.2
Suzuki, T.3
Walther, H.4
-
29
-
-
0006872819
-
Photovoltage on silicon surfaces measured by scanning tunneling microscopy
-
Y. Kuk, R. S. Becker, P. J. Silverman, G. P. Kochanski. Photovoltage on silicon surfaces measured by scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 545–550 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 545-550
-
-
Kuk, Y.1
Becker, R.S.2
Silverman, P.J.3
Kochanski, G.P.4
-
30
-
-
0010801791
-
Tunneling spectroscopy analysis of optically active wide band-gap semiconductors
-
D. A. Bonnell, G. S. Rohrer, R. H. French. Tunneling spectroscopy analysis of optically active wide band-gap semiconductors. J. Vac. Sci. Technol. B9, 551–556 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 551-556
-
-
Bonnell, D.A.1
Rohrer, G.S.2
French, R.H.3
-
31
-
-
0000596506
-
Prism-coupled light emission from a scanning tunneling microscope
-
K. Takeuchi, Y. Uehara, S. Ushioda, S. Morita. Prism-coupled light emission from a scanning tunneling microscope. J. Vac. Sci. Technol. B9, 557–560 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 557-560
-
-
Takeuchi, K.1
Uehara, Y.2
Ushioda, S.3
Morita, S.4
-
32
-
-
0010795421
-
Photoassisted tunneling spectroscopy: Preliminary results on tungsten diselenide
-
S. Akari, M. Ch. Lux-Steiner, M. Vögt, M. Stachel, K. Dransfeld. Photoassisted tunneling spectroscopy: Preliminary results on tungsten diselenide. J. Vac. Sci. Technol. B9, 561–563 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 561-563
-
-
Akari, S.1
Lux-Steiner, M.C.H.2
Vögt, M.3
Stachel, M.4
Dransfeld, K.5
-
33
-
-
0001178778
-
Scanning tunneling microscopy of photoexcited carriers at the silicon(100) surface
-
D. G. Cahill, R. J. Hamers. Scanning tunneling microscopy of photoexcited carriers at the silicon(100) surface. J. Vac. Sci. Technol. B9, 564–567 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 564-567
-
-
Cahill, D.G.1
Hamers, R.J.2
-
34
-
-
0004964036
-
Analysis and compensation of thermal effects in laser-assisted scanning tunneling microscopy
-
S. Grafström, J. Kowalski, R. Neumann, O. Probst, M. Wörtge. Analysis and compensation of thermal effects in laser-assisted scanning tunneling microscopy. J. Vac. Sci. Technol. B9, 568–572 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 568-572
-
-
Grafström, S.1
Kowalski, J.2
Neumann, R.3
Probst, O.4
Wörtge, M.5
-
37
-
-
0026896888
-
Observation of local photoemission using a scanning tunneling microscope
-
J. K. Gimzewski, R. Berndt, R. R. Schlittler. Observation of local photoemission using a scanning tunneling microscope. Ultramicroscopy 42–44, 366–370 (1992).
-
(1992)
Ultramicroscopy
, pp. 366-370
-
-
Gimzewski, J.K.1
Berndt, R.2
Schlittler, R.R.3
-
38
-
-
0026896975
-
Microscopic theory of light emission from the scanning tunneling microscope
-
M. Tsukada, T. Schimizu, K. Kobayashi. Microscopic theory of light emission from the scanning tunneling microscope. Ultramicroscopy 42–44, 360–365 (1992).
-
(1992)
Ultramicroscopy
, pp. 360-365
-
-
Tsukada, M.1
Schimizu, T.2
Kobayashi, K.3
-
39
-
-
4243329332
-
Scanning tunneling microscopy and photons
-
R. Möller, S. Akari, C. Baur, B. Koslowski, K. Dransfeld. Scanning tunneling microscopy and photons. AIP Conf Proceedings 241, 314–327 (1992).
-
(1992)
AIP Conf Proceedings
, vol.241
, pp. 314-327
-
-
Möller, R.1
Akari, S.2
Baur, C.3
Koslowski, B.4
Dransfeld, K.5
-
40
-
-
84957226688
-
New versatile room–temperature field ion scanning tunneling microscopy
-
T. Sakurai, T. Hashizume, Y. Hasegawa, I. Kamiya, N. Sano, K. Yokoyama, H. Tanaka, I. Sumita, S. Hyodo. New versatile room–temperature field ion scanning tunneling microscopy. J. Vac. Sci. Technol. A8, 324–326 (1990).
-
(1990)
J. Vac. Sci. Technol.
, vol.A8
, pp. 324-326
-
-
Sakurai, T.1
Hashizume, T.2
Hasegawa, Y.3
Kamiya, I.4
Sano, N.5
Yokoyama, K.6
Tanaka, H.7
Sumita, I.8
Hyodo, S.9
-
41
-
-
0000705571
-
Biological materials studied with dynamic force microscopy
-
D. Anselmetti, M. Dreier, R. Lüthi, T. Richmond, E. Meyer, J. Frommer, H.-J. Güntherodt. Biological materials studied with dynamic force microscopy. J. Vac. Sci. Technol. B12, 1500–1503 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1500-1503
-
-
Anselmetti, D.1
Dreier, M.2
Lüthi, R.3
Richmond, T.4
Meyer, E.5
Frommer, J.6
Güntherodt, H.-J.7
-
42
-
-
0000705572
-
Progress in noncontact dynamic force microscopy
-
R. Lüthi, E. Meyer, L. Howald, H. Haefke, D. Anselmetti, M. Dreier, M. Rüetschi, T. Bonner, R. M. Overney, J. Frommer, H.-J. Güntherodt. Progress in noncontact dynamic force microscopy. J. Vac. Sci. Technol. B12, 1673–1676 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1673-1676
-
-
Lüthi, R.1
Meyer, E.2
Howald, L.3
Haefke, H.4
Anselmetti, D.5
Dreier, M.6
Rüetschi, M.7
Bonner, T.8
Overney, R.M.9
Frommer, J.10
Güntherodt, H.-J.11
-
43
-
-
4243113927
-
Dynamic force microscopy in liquids
-
M. Dreier, D. Anselmetti, T. Richmond, U. Dammer, H.-J. Güntherodt. Dynamic force microscopy in liquids. J. Appl. Phys. 76, 5095–5098 (1994).
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 5095-5098
-
-
Dreier, M.1
Anselmetti, D.2
Richmond, T.3
Dammer, U.4
Güntherodt, H.-J.5
-
45
-
-
0002950715
-
Scanning attractive force microscope using photothermal vibration
-
N. Umeda, S. Ishizaki, H. Uwai. Scanning attractive force microscope using photothermal vibration. J. Vac. Sci. Technol. B9, 1318–1322 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 1318-1322
-
-
Umeda, N.1
Ishizaki, S.2
Uwai, H.3
-
47
-
-
11944250146
-
Atomic Force Microscopy
-
D. Rugar, P. Hansma. Atomic Force Microscopy. Phys. Today 43, 23–30 (1990).
-
(1990)
Phys. Today
, vol.43
, pp. 23-30
-
-
Rugar, D.1
Hansma, P.2
-
48
-
-
33745986903
-
Surface characterization of materials at ambient conditions by scanning tunneling microscopy (STM) and atomic force microscopy (AFM)
-
S. N. Magonov. Surface characterization of materials at ambient conditions by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Appl. Spectrosc. Rev. 28, 1–121 (1993).
-
(1993)
Appl. Spectrosc. Rev.
, vol.28
, pp. 1-121
-
-
Magonov, S.N.1
-
49
-
-
0001016149
-
Scanning tunneling and atomic force microscopy in organic chemistry
-
J. Frommer. Scanning tunneling and atomic force microscopy in organic chemistry. Angew. Chem. 104, 1325–1357 (1992).
-
(1992)
Angew. Chem.
, vol.104
, pp. 1325-1357
-
-
Frommer, J.1
-
50
-
-
0006810309
-
Atomic force and scanning tunneling microscopy of organic surfaces
-
H. Fuchs. Atomic force and scanning tunneling microscopy of organic surfaces. J. Mol. Struct. 292, 29–47 (1993).
-
(1993)
J. Mol. Struct.
, vol.292
, pp. 29-47
-
-
Fuchs, H.1
-
51
-
-
0000994148
-
Surface analysis with atomic force microscopy through measurement in air and under liquids
-
G. Friedbacher, T. Prohaska, M. Grasserbauer. Surface analysis with atomic force microscopy through measurement in air and under liquids. Mikrochim. Acta 113, 179–202 (1994).
-
(1994)
Mikrochim. Acta
, vol.113
, pp. 179-202
-
-
Friedbacher, G.1
Prohaska, T.2
Grasserbauer, M.3
-
53
-
-
0039661802
-
Optical-beam-deflection atomic force microscopy: The sodium chloride(001) surface
-
G. Meyer, N. M. Amer. Optical-beam-deflection atomic force microscopy: The sodium chloride(001) surface. Appl. Phys. Lett. 53, 2400–2401 (1988).
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2400-2401
-
-
Meyer, G.1
Amer, N.M.2
-
54
-
-
77952760920
-
Microfabrication of cantilever styli for the atomic force microscope
-
T. R. Albrecht, S. Akamine, T. E. Carver, C. F. Quate. Microfabrication of cantilever styli for the atomic force microscope. J. Vac. Sci. Technol. A8, 3386–3396 (1990).
-
(1990)
J. Vac. Sci. Technol.
, vol.A8
, pp. 3386-3396
-
-
Albrecht, T.R.1
Akamine, S.2
Carver, T.E.3
Quate, C.F.4
-
55
-
-
84881605956
-
Micromachined silicon sensors for scanning force microscopy
-
O. Wolter, Th. Bayer, J. Greschner. Micromachined silicon sensors for scanning force microscopy. J. Vac. Sci. Technol. B9, 1353–1357 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 1353-1357
-
-
Wolter, O.1
Bayer, T.2
Greschner, J.3
-
56
-
-
0346891488
-
Insitu investigation of aluminum gallium arsenide/gallium arsenide multilayer structures under inert and reactive media by atomic force microscopy
-
T. Prohaska, G. Friedbacher, M. Grasserbauer, H. Nickel, R. Lösch, W. Schlapp. Insitu investigation of aluminum gallium arsenide/gallium arsenide multilayer structures under inert and reactive media by atomic force microscopy. Anal. Chem. 67, 1530–1535 (1995).
-
(1995)
Anal. Chem.
, vol.67
, pp. 1530-1535
-
-
Prohaska, T.1
Friedbacher, G.2
Grasserbauer, M.3
Nickel, H.4
Lösch, R.5
Schlapp, W.6
-
57
-
-
0029207025
-
Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy
-
I. Schmitz, T. Prohaska, G. Friedbacher, M. Schreiner, M. Grasserbauer. Investigation of corrosion processes on cleavage edges of potash-lime-silica glasses by atomic force microscopy. Fresenius J. Anal. Chem. 353, 666–669 (1995).
-
(1995)
Fresenius J. Anal. Chem.
, vol.353
, pp. 666-669
-
-
Schmitz, I.1
Prohaska, T.2
Friedbacher, G.3
Schreiner, M.4
Grasserbauer, M.5
-
58
-
-
84874953797
-
Atomic-scale imaging of calcite growth and dissolution in real time
-
P. E. Hillner, A. J. Gratz, S. Manne, P. K. Hansma. Atomic-scale imaging of calcite growth and dissolution in real time. Geology 20, 359–362 (1992).
-
(1992)
Geology
, vol.20
, pp. 359-362
-
-
Hillner, P.E.1
Gratz, A.J.2
Manne, S.3
Hansma, P.K.4
-
59
-
-
0026035212
-
Atomic-resolution electrochemistry with the atomic force microscope: Copper deposition on gold
-
S. Manne, P. K. Hansma, J. Massie, V. B. Elings, A. A. Gewirth. Atomic-resolution electrochemistry with the atomic force microscope: Copper deposition on gold. Science 251, 183–186 (1991).
-
(1991)
Science
, vol.251
, pp. 183-186
-
-
Manne, S.1
Hansma, P.K.2
Massie, J.3
Elings, V.B.4
Gewirth, A.A.5
-
60
-
-
0347829297
-
Atomic resolution electrochemistry of underpotential deposition processes
-
A. A. Gewirth. Atomic resolution electrochemistry of underpotential deposition processes. AIP Conf Proceedings 241, 253–261 (1992).
-
(1992)
AIP Conf Proceedings
, vol.241
, pp. 253-261
-
-
Gewirth, A.A.1
-
61
-
-
0343681011
-
Atomic-scale friction of a tungsten tip on a graphite surface
-
C. M. Mate, G. M. McClelland, R. Erlandsson, S. Chiang. Atomic-scale friction of a tungsten tip on a graphite surface. Phys. Rev. Lett. 59, 1942–1945 (1987).
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 1942-1945
-
-
Mate, C.M.1
McClelland, G.M.2
Erlandsson, R.3
Chiang, S.4
-
62
-
-
0001384474
-
Tribological characteristics of amorphous carbon films investigated by point contact microscopy
-
T. Miyamoto, R. Kaneko, S. Miyake. Tribological characteristics of amorphous carbon films investigated by point contact microscopy. J. Vac. Sci. Technol. B9, 1336–1339 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 1336-1339
-
-
Miyamoto, T.1
Kaneko, R.2
Miyake, S.3
-
63
-
-
0037975349
-
Sliding friction measurements of physisorbed monolayers: a comparison of solid and liquid films
-
J. Krim, R. Chiarello. Sliding friction measurements of physisorbed monolayers: a comparison of solid and liquid films. J. Vac. Sci. Technol. B9, 1343–1346 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 1343-1346
-
-
Krim, J.1
Chiarello, R.2
-
64
-
-
0001618503
-
Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy
-
R. M. Overney, T. Bonner, E. Meyer, M. Rüetschi, R. Lüthi, L. Howald, J. Frommer, H.-J. Güntherodt, M. Fujihira, H. Takano. Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy. J. Vac. Sci. Technol. B12, 1973–1976 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1973-1976
-
-
Overney, R.M.1
Bonner, T.2
Meyer, E.3
Rüetschi, M.4
Lüthi, R.5
Howald, L.6
Frommer, J.7
Güntherodt, H.-J.8
Fujihira, M.9
Takano, H.10
-
65
-
-
0028020164
-
Functional group imaging by chemical force microscopy
-
C. D. Frisbie, L. F. Rozsnyai, A. Noy, M. S. Wrighton, C. S. Lieber. Functional group imaging by chemical force microscopy. Science 265, 2071–2074 (1994).
-
(1994)
Science
, vol.265
, pp. 2071-2074
-
-
Frisbie, C.D.1
Rozsnyai, L.F.2
Noy, A.3
Wrighton, M.S.4
Lieber, C.S.5
-
66
-
-
0000156345
-
Using force modulation to image surface elasticities with the atomic force microscope
-
P. Maivald, H.-J. Butt, S. A. C. Gould, C. B. Prater, B. Drake, J. A. Gurley, V. B. Elings, P. K. Hansma. Using force modulation to image surface elasticities with the atomic force microscope. Nanotechnology 2, 103–106 (1991).
-
(1991)
Nanotechnology
, vol.2
, pp. 103-106
-
-
Maivald, P.1
Butt, H.-J.2
Gould, S.A.C.3
Prater, C.B.4
Drake, B.5
Gurley, J.A.6
Elings, V.B.7
Hansma, P.K.8
-
67
-
-
84927762517
-
Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope
-
N. A. Burnham, R. J. Colton. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope. J. Vac. Sci. Technol. A7, 2906–2913 (1989).
-
(1989)
J. Vac. Sci. Technol.
, vol.A7
, pp. 2906-2913
-
-
Burnham, N.A.1
Colton, R.J.2
-
68
-
-
0000294382
-
Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass
-
J. H. Hoh, J.-P. Revel, P. K. Hansma. Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology 2, 119–122 (1991).
-
(1991)
Nanotechnology
, vol.2
, pp. 119-122
-
-
Hoh, J.H.1
Revel, J.-P.2
Hansma, P.K.3
-
69
-
-
0000383748
-
Electrostatic and contact forces in force microscopy
-
H. W. Hao, A. M. Baró, J.J.Sáenz. Electrostatic and contact forces in force microscopy. J. Vac. Sci. Technol. B9, 1323–1328 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 1323-1328
-
-
Hao, H.W.1
Baró, A.M.2
-
70
-
-
0000561825
-
Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities
-
H. A. Mizes, K.-G. Loh, R. J. D. Miller, S. K. Ahuja, E. F. Grabowski. Submicron probe of polymer adhesion with atomic force microscopy: Dependence on topography and material inhomogeneities. Appl. Phys. Lett. 59, 2901–2903 (1991).
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 2901-2903
-
-
Mizes, H.A.1
Loh, K.-G.2
Miller, R.J.D.3
Ahuja, S.K.4
Grabowski, E.F.5
-
71
-
-
0026038548
-
Electrostatic interaction in atomic force microscopy
-
H.-J. Butt. Electrostatic interaction in atomic force microscopy. Biophys. J. 60, 777–785 (1991).
-
(1991)
Biophys. J.
, vol.60
, pp. 777-785
-
-
Butt, H.-J.1
-
72
-
-
0000746799
-
Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic force microscope
-
A. L. Weisenhorn, P. Maivald, H.-J. Butt, P. K. Hansma. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic force microscope. Phys. Rev. B 45, 11226–11232 (1992).
-
(1992)
Phys. Rev. B
, vol.45
, pp. 11226-11232
-
-
Weisenhorn, A.L.1
Maivald, P.2
Butt, H.-J.3
Hansma, P.K.4
-
73
-
-
0026896658
-
Measurement of forces in liquids using a force microscope
-
W. A. Ducker, T. J. Senden, R. M. Pashley. Measurement of forces in liquids using a force microscope. Langmuir 8, 1831–1836 (1992).
-
(1992)
Langmuir
, vol.8
, pp. 1831-1836
-
-
Ducker, W.A.1
Senden, T.J.2
Pashley, R.M.3
-
74
-
-
0001691934
-
Quantized adhesion detected with the atomic force microscope
-
J. H. Hoh, J. P. Cleveland, C. B. Prater, J.-P. Revel, P. K. Hansma. Quantized adhesion detected with the atomic force microscope. J. Am. Chem. Soc. 114, 4917–4918 (1992).
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 4917-4918
-
-
Hoh, J.H.1
Cleveland, J.P.2
Prater, C.B.3
Revel, J.-P.4
Hansma, P.K.5
-
75
-
-
0141547797
-
Characterization of surface energetic behavior by atomic force microscopy
-
A. Kawai, H. Nagata, M. Takata. Characterization of surface energetic behavior by atomic force microscopy. Jpn. J. Appl. Phys. 31, L977–L979 (1992).
-
(1992)
Jpn. J. Appl. Phys.
, vol.31
, pp. L977-L979
-
-
Kawai, A.1
Nagata, H.2
Takata, M.3
-
76
-
-
0001353845
-
Friction effects on force measurements with an atomic force microscope
-
J. H. Hoh, A. Engel. Friction effects on force measurements with an atomic force microscope. Langmuir 9, 3310–3312 (1993).
-
(1993)
Langmuir
, vol.9
, pp. 3310-3312
-
-
Hoh, J.H.1
Engel, A.2
-
77
-
-
0001551895
-
Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects
-
B. Anczykowski, D. Krüger, H. Fuchs. Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects. Phys. Rev. B 53, 15485–15488 (1996).
-
(1996)
Phys. Rev. B
, vol.53
, pp. 15485-15488
-
-
Anczykowski, B.1
Krüger, D.2
Fuchs, H.3
-
78
-
-
0030435432
-
Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment an simulation
-
B. Anczykowski, D. Krüger, K. L. Babcock, H. Fuchs. Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment an simulation. Ultramicroscopy 66, 251–259 (1996).
-
(1996)
Ultramicroscopy
, vol.66
, pp. 251-259
-
-
Anczykowski, B.1
Krüger, D.2
Babcock, K.L.3
Fuchs, H.4
-
79
-
-
0030678858
-
Physical properties of dynamic force microscopies in contact and noncontact operation
-
D. Krüger, B. Anczykowski, H. Fuchs. Physical properties of dynamic force microscopies in contact and noncontact operation. Ann. Phys. 6, 341–363 (1997).
-
(1997)
Ann. Phys.
, vol.6
, pp. 341-363
-
-
Krüger, D.1
Anczykowski, B.2
Fuchs, H.3
-
80
-
-
0027610690
-
Fractured polymer/silica fiber surface studied by tapping mode atomic force microscope
-
Q. Zhong, D. Inniss, K. Kjoller, V. B. Elings. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscope. Surf. Sci. Lett. 290, L688–L692 (1993).
-
(1993)
Surf. Sci. Lett.
, vol.290
, pp. L688-L692
-
-
Zhong, Q.1
Inniss, D.2
Kjoller, K.3
Elings, V.B.4
-
81
-
-
0027694906
-
High resolution imaging of cell surface using a tapping-mode atomic force microscopy
-
K. Umemura, H. Arakawa, A. Ikai. High resolution imaging of cell surface using a tapping-mode atomic force microscopy. Jpn. J. Appl. Phys. Part 2 11B, L1711–L1714 (1993).
-
(1993)
Jpn. J. Appl. Phys.
, vol.11 B
, pp. L1711-L1714
-
-
Umemura, K.1
Arakawa, H.2
Ikai, A.3
-
82
-
-
20144371627
-
Tapping mode atomic force microscopy in liquids
-
P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. E. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, V. Elings. Tapping mode atomic force microscopy in liquids. Appl. Phys. Lett. 64, 1738–1740 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 1738-1740
-
-
Hansma, P.K.1
Cleveland, J.P.2
Radmacher, M.3
Walters, D.A.4
Hillner, P.E.5
Bezanilla, M.6
Fritz, M.7
Vie, D.8
Hansma, H.G.9
Prater, C.B.10
Massie, J.11
Fukunaga, L.12
Gurley, J.13
Elings, V.14
-
83
-
-
24644500398
-
Tapping mode atomic force microscopy in liquid
-
C. A. J. Putman, K. O. Van der Werf, B. G. De Grooth, N. F. Van Hulst, J. Greve. Tapping mode atomic force microscopy in liquid. Appl. Phys. Lett. 64, 2454–2456 (1994).
-
(1994)
Appl. Phys. Lett.
, vol.64
, pp. 2454-2456
-
-
Putman, C.A.J.1
Van der Werf, K.O.2
De Grooth, B.G.3
Van Hulst, N.F.4
Greve, J.5
-
84
-
-
0001378004
-
Imaging of cells with atomic force microscopy at a tapping mode
-
T. Shibata-Seki, W. Watanabe, J. Masai. Imaging of cells with atomic force microscopy at a tapping mode. J. Vac. Sci. Technol. B12, 1530–1534 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1530-1534
-
-
Shibata-Seki, T.1
Watanabe, W.2
Masai, J.3
-
85
-
-
0028100908
-
Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy
-
C. A. J. Putman, K. O. van der Werf, B. G. de Grooth, N. F. van Hulst, J. Greve. Viscoelasticity of living cells allows high resolution imaging by tapping mode atomic force microscopy. Biophys. J. 67, 1749–1753 (1994).
-
(1994)
Biophys. J.
, vol.67
, pp. 1749-1753
-
-
Putman, C.A.J.1
van der Werf, K.O.2
de Grooth, B.G.3
van Hulst, N.F.4
Greve, J.5
-
86
-
-
0027960444
-
Three-dimensional structure of extended chromatin fibers as revealed by tapping-mode scanning force microscopy
-
S. H. Leuba, G. Yang, C. Robert, B. Samori, K. van Holde, J. Zlatanova, C. Bustamente. Three-dimensional structure of extended chromatin fibers as revealed by tapping-mode scanning force microscopy. Proc. Natl. Acad. Sci. USA 91, 11621–11625 (1994).
-
(1994)
Proc. Natl. Acad. Sci. USA
, vol.91
, pp. 11621-11625
-
-
Leuba, S.H.1
Yang, G.2
Robert, C.3
Samori, B.4
van Holde, K.5
Zlatanova, J.6
Bustamente, C.7
-
87
-
-
33750306098
-
Atomic force microscope—force mapping and profiling on a sub 100–Å scale
-
Y. Martin, C. C. Williams, H. K. Wickramasinghe. Atomic force microscope—force mapping and profiling on a sub 100–Å scale. J. Appl. Phys. 61, 4723–4729 (1987).
-
(1987)
J. Appl. Phys.
, vol.61
, pp. 4723-4729
-
-
Martin, Y.1
Williams, C.C.2
Wickramasinghe, H.K.3
-
88
-
-
0348175886
-
Deposition and imaging of localized charge on insulator surfaces using a force microscope
-
J. E. Stern, B. D. Terris, H. J. Mamin, D. Rugar. Deposition and imaging of localized charge on insulator surfaces using a force microscope. Appl. Phys. Lett. 53, 2717–2719 (1988).
-
(1988)
Appl. Phys. Lett.
, vol.53
, pp. 2717-2719
-
-
Stern, J.E.1
Terris, B.D.2
Mamin, H.J.3
Rugar, D.4
-
89
-
-
84957232583
-
Localized charge force microscopy
-
B. D. Terris, J. E. Stern, D. Rugar, H. J. Manin. Localized charge force microscopy. J. Vac. Sci. Technol. A8, 374–377 (1990).
-
(1990)
J. Vac. Sci. Technol.
, vol.A8
, pp. 374-377
-
-
Terris, B.D.1
Stern, J.E.2
Rugar, D.3
Manin, H.J.4
-
90
-
-
0000657908
-
Structural study of Langmuir–Blodgett films by scanning surface potential microscopy
-
M. Fujihira, H. Kawate. Structural study of Langmuir–Blodgett films by scanning surface potential microscopy. J. Vac. Sci. Technol. B12, 1604–1608 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1604-1608
-
-
Fujihira, M.1
Kawate, H.2
-
93
-
-
4244085510
-
Magnetic imaging by ‘force microscopy’ with 1000 A resolution
-
Y. Martin, H. K. Wickramasinghe. Magnetic imaging by ‘force microscopy’ with 1000 A resolution. Appl. Phys. Lett. 50, 1455–1457 (1987).
-
(1987)
Appl. Phys. Lett.
, vol.50
, pp. 1455-1457
-
-
Martin, Y.1
Wickramasinghe, H.K.2
-
94
-
-
0026896970
-
Applications of magnetic force microscopy in magnetic storage device manufacturing
-
G. Persch, H. Strecker. Applications of magnetic force microscopy in magnetic storage device manufacturing. Ultramicroscopy 42–44, 1269–1274 (1992).
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 1269-1274
-
-
Persch, G.1
Strecker, H.2
-
95
-
-
0000661712
-
Theory of Van der Waals microscopy
-
U. Hartmann. Theory of Van der Waals microscopy. J. Vac. Sci. Technol. B9, 465–469 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 465-469
-
-
Hartmann, U.1
-
96
-
-
0013357990
-
Near-field optics: Light for the world of NANO
-
D. W. Pohl, L. Novotny. Near-field optics: Light for the world of NANO. J. Vac. Sci. Technol. B12, 1441–1446 (1994).
-
(1994)
J. Vac. Sci. Technol.
, vol.B12
, pp. 1441-1446
-
-
Pohl, D.W.1
Novotny, L.2
-
98
-
-
5544268684
-
Photon scanning tunneling microscopy
-
R. C. Reddick. Photon scanning tunneling microscopy. AIP Conf Proceedings 241, 37–50 (1992).
-
(1992)
AIP Conf Proceedings
, vol.241
, pp. 37-50
-
-
Reddick, R.C.1
-
99
-
-
0028607173
-
The tetrahedral tip as a probe for scanning near-field optical microscopy at 30 nm resolution
-
U. C. Fischer, J. Koglin, H. Fuchs. The tetrahedral tip as a probe for scanning near-field optical microscopy at 30 nm resolution. J. Microscopy. 176, 231–237 (1994).
-
(1994)
J. Microscopy.
, vol.176
, pp. 231-237
-
-
Fischer, U.C.1
Koglin, J.2
Fuchs, H.3
-
100
-
-
0001542161
-
Material contrast in scanning near-field optical microscopy at 1–10 nm resolution
-
J. Koglin, U. C. Fischer, H. Fuchs. Material contrast in scanning near-field optical microscopy at 1–10 nm resolution. Phys. Rev. B 55, 7977–7984 (1997).
-
(1997)
Phys. Rev. B
, vol.55
, pp. 7977-7984
-
-
Koglin, J.1
Fischer, U.C.2
Fuchs, H.3
-
101
-
-
0043160488
-
The photon scanning tunneling microscope
-
T. L. Ferrell, J. P. Goundonnet, R. C. Reddick, S. L. Sharp, R. J. Warmack. The photon scanning tunneling microscope. J. Vac. Sci. Technol. B9, 525–530 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 525-530
-
-
Ferrell, T.L.1
Goundonnet, J.P.2
Reddick, R.C.3
Sharp, S.L.4
Warmack, R.J.5
-
102
-
-
0026899438
-
Progress in photon scanning tunneling microscopy (PSTM)
-
T. L. Ferrell, S. L. Sharp, R. J. Warmack. Progress in photon scanning tunneling microscopy (PSTM). Ultramicroscopy 42–44, 408–415 (1992).
-
(1992)
Ultramicroscopy
, pp. 408-415
-
-
Ferrell, T.L.1
Sharp, S.L.2
Warmack, R.J.3
-
103
-
-
0026898276
-
Evanescent-field optical microscopy: Effects of polarization, tip shape, and radiative waves
-
N. F. van Hulst, F. B. Segerink, F. Achten, B. Bögler. Evanescent-field optical microscopy: Effects of polarization, tip shape, and radiative waves. Ultramicroscopy 42–44, 416–421 (1992).
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 416-421
-
-
van Hulst, N.F.1
Segerink, F.B.2
Achten, F.3
Bögler, B.4
-
104
-
-
0042189262
-
Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope
-
P. J. Moyer, C. L. Jahncke, M. A. Paesler, R. C. Reddick, R. J. Warmack. Spectroscopy in the evanescent field with an analytical photon scanning tunneling microscope. Phys. Lett. A 145, 343–347 (1990).
-
(1990)
Phys. Lett. A
, vol.145
, pp. 343-347
-
-
Moyer, P.J.1
Jahncke, C.L.2
Paesler, M.A.3
Reddick, R.C.4
Warmack, R.J.5
-
105
-
-
0000005888
-
Analytical photon scanning tunneling microscopy
-
M. A. Paesler, P. J. Moyer, C. J. Jahncke, C. E. Johnson, R. C. Reddick, R. J. Warmack, T. L. Ferrell. Analytical photon scanning tunneling microscopy. Phys. Rev.B 42, 6750–6753 (1990).
-
(1990)
Phys. Rev.B
, vol.42
, pp. 6750-6753
-
-
Paesler, M.A.1
Moyer, P.J.2
Jahncke, C.J.3
Johnson, C.E.4
Reddick, R.C.5
Warmack, R.J.6
Ferrell, T.L.7
-
106
-
-
11944264929
-
Scanning plasmon near-field microscope
-
M. Specht, J. D. Pedarnig, W. M. Heckl, T. W. Hänsch. Scanning plasmon near-field microscope. Phys. Rev. Lett. 68, 476–479 (1992).
-
(1992)
Phys. Rev. Lett.
, vol.68
, pp. 476-479
-
-
Specht, M.1
Pedarnig, J.D.2
Heckl, W.M.3
Hänsch, T.W.4
-
107
-
-
24844454458
-
Scanning electrochemical microscopy
-
A. J. Bard, F.-R.F. Fan, J. Kwak, O. Lev. Scanning electrochemical microscopy. Introduction and principles. Anal. Chem. 61, 132–138 (1989).
-
(1989)
Introduction and principles. Anal. Chem.
, vol.61
, pp. 132-138
-
-
Bard, A.J.1
Fan, F.-R.F.2
Kwak, J.3
Lev, O.4
-
108
-
-
0000140462
-
Scanning electrochemical microscopy
-
A. J. Bard, P. R. Unwin, D. O. Wipf, F. Zhou. Scanning electrochemical microscopy. AIP Conf. Proceedings 241, 235–247 (1992).
-
(1992)
AIP Conf. Proceedings
, vol.241
, pp. 235-247
-
-
Bard, A.J.1
Unwin, P.R.2
Wipf, D.O.3
Zhou, F.4
-
109
-
-
0025954563
-
Chemical imaging of surfaces with the scanning electrochemical microscope
-
A. J. Bard, F.-R.F. Fan, D. T. Pierce, P. R. Unwin, D. O. Wipf, F. Zhou. Chemical imaging of surfaces with the scanning electrochemical microscope. Science 254, 68–74 (1991).
-
(1991)
Science
, vol.254
, pp. 68-74
-
-
Bard, A.J.1
Fan, F.-R.F.2
Pierce, D.T.3
Unwin, P.R.4
Wipf, D.O.5
Zhou, F.6
-
110
-
-
0037867862
-
Scanning capacitance microscopy
-
J. R. Matey, J. Blanc. Scanning capacitance microscopy. J. Appl. Phys. 57, 1437–1444 (1985).
-
(1985)
J. Appl. Phys.
, vol.57
, pp. 1437-1444
-
-
Matey, J.R.1
Blanc, J.2
-
112
-
-
36449009560
-
Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy
-
R. C. Barrett, C. F. Quate. Charge storage in a nitride-oxide-silicon medium by scanning capacitance microscopy. J. Appl. Phys. 70, 2725–2733 (1991).
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 2725-2733
-
-
Barrett, R.C.1
Quate, C.F.2
-
113
-
-
0001680985
-
Lateral dopant profiling in semiconductors by force microscopy using capacitive detection
-
D. W. Abraham, C. Williams, J. Slinkman, H. K. Wickramasinghe. Lateral dopant profiling in semiconductors by force microscopy using capacitive detection. J. Vac. Sci. Technol. B9, 703–706 (1991).
-
(1991)
J. Vac. Sci. Technol.
, vol.B9
, pp. 703-706
-
-
Abraham, D.W.1
Williams, C.2
Slinkman, J.3
Wickramasinghe, H.K.4
-
114
-
-
0024604960
-
The scanning ion conductance microscope
-
P. K. Hansma, B. Drake, O. Marti, S. A. C. Gould, C. B. Prater. The scanning ion conductance microscope. Science 243, 641–643 (1989).
-
(1989)
Science
, vol.243
, pp. 641-643
-
-
Hansma, P.K.1
Drake, B.2
Marti, O.3
Gould, S.A.C.4
Prater, C.B.5
-
115
-
-
21544432308
-
Improved scanning ion-conductance microscope using microfabricated probes
-
C. B. Prater, P. K. Hansma, M. Tortonese, C. F. Quate. Improved scanning ion-conductance microscope using microfabricated probes. Rev. Sci. Instrum. 62, 2634–2638 (1991).
-
(1991)
Rev. Sci. Instrum.
, vol.62
, pp. 2634-2638
-
-
Prater, C.B.1
Hansma, P.K.2
Tortonese, M.3
Quate, C.F.4
-
117
-
-
85076181124
-
Near field acoustic microscopy
-
B. T. Khuri-Yakub, S. Akamine, B. Hadimioglu, H. Yamada, C. F. Quate. Near field acoustic microscopy. Proc. SPIE 1556, 30–39 (1992).
-
(1992)
Proc. SPIE
, vol.1556
, pp. 30-39
-
-
Khuri-Yakub, B.T.1
Akamine, S.2
Hadimioglu, B.3
Yamada, H.4
Quate, C.F.5
-
118
-
-
0029356678
-
1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy
-
A. Michels, F. Meinen, T. Murdfield, W. Göhde, U. C. Fischer, E. Beckmann, H. Fuchs. 1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy. Thin Solid Films 264, 172–175 (1995).
-
(1995)
Thin Solid Films
, vol.264
, pp. 172-175
-
-
Michels, A.1
Meinen, F.2
Murdfield, T.3
Göhde, W.4
Fischer, U.C.5
Beckmann, E.6
Fuchs, H.7
|