Surface resistance imaging with a scanning near-field microwave microscope

Applied Physics Letters

Volumn 71, Issue 12, 1997, Pages 1736-1738

  Steinhauer, D E ^a   Vlahacos, C P ^a   Dutta, S K ^a   Wellstood, F C ^a   Anlage, Steven M ^a  

^a Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001222552     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120020     Document Type: Article

References (14)

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12. 0=50 Ω.
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