How to extract spontaneous polarization information from experimental data in electric force microscopy

Surface Science

Volumn 415, Issue 1-2, 1998, Pages 178-182

  Franke, K ^a   Huelz, H ^a,b   Weihnacht, M ^a  

^a IFW DRESDEN   (Germany)

^b Kodak AG   (Germany)

Author keywords

Ferroelectricity; Microscopy atomic force; Polarization dielectric; Thin films dielectric

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRICITY; MATHEMATICAL MODELS; PERMITTIVITY MEASUREMENT; POLARIZATION; THIN FILMS;

ELECTRIC FORCE MICROSCOPY (EFM); SPONTANEOUS POLARIZATION;

DIELECTRIC FILMS;

EID: 0032154245     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00585-8     Document Type: Article

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