Resolution and contrast in Kelvin probe force microscopy

Journal of Applied Physics

Volumn 84, Issue 3, 1998, Pages 1168-1173

  Jacobs, H O ^a   Leuchtmann, P ^a   Homan, O J ^a   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001648770     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368181     Document Type: Article

References (22)

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