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Volumn 90, Issue 12, 1999, Pages 983-989

Dynamic behavior of domain-related topography and surface potential on the BaTiO3 (100) surface by variable temperature scanning surface potential microscopy

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PHASE TRANSITIONS; POLARIZATION; STRESS RELAXATION; SURFACE STRUCTURE; THERMAL EFFECTS;

EID: 0033345130     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (18)

References (53)
  • 33
    • 0343110180 scopus 로고    scopus 로고
    • note
    • Eff is the total effective capacitance including the tip apex, tip edges, and cantilever surface: Formula presented
  • 40
    • 0342675979 scopus 로고    scopus 로고
    • note
    • Digital Instruments Dimension 3000 NS-III. Metal coated tips (1 ≈ 225 μm, resonant frequency ∼ 60 kHz) were used. The lift height for the interleave scan in the SSPM was usually 100 nm. The scan rate varied from 0.2 Hz for big scans (∼ 40 μm) to 1 Hz for smaller scans (∼ 10 μm).
  • 43
    • 0343982143 scopus 로고    scopus 로고
    • note
    • The assumption would not be valid in the case of dynamic force microscopy which operates at a height of less than 10 nm.
  • 44
    • 0000317725 scopus 로고
    • cited in Ref. [35]
    • Merz, W.J.: Phys. Rev. 91 (1953) 513 (cited in Ref. [35]).
    • (1953) Phys. Rev. , vol.91 , pp. 513
    • Merz, W.J.1
  • 46
    • 0000553158 scopus 로고
    • cited in Ref. [35]
    • Kay, H.E.; Vousden, P.: Phil. Mag. 40 (1949) 1019 (cited in Ref. [35]) and Landolt-Börnstein New Series Vol. 16a, in: K.-H. Hellwege, A.M. Hellwege (eds), Springer-Verlag, Berlin (1981).
    • (1949) Phil. Mag. , vol.40 , pp. 1019
    • Kay, H.E.1    Vousden, P.2
  • 47
    • 0003524125 scopus 로고
    • Springer-Verlag, Berlin
    • Kay, H.E.; Vousden, P.: Phil. Mag. 40 (1949) 1019 (cited in Ref. [35]) and Landolt-Börnstein New Series Vol. 16a, in: K.-H. Hellwege, A.M. Hellwege (eds), Springer-Verlag, Berlin (1981).
    • (1981) Landolt-Börnstein New Series , vol.16 A
    • Hellwege, K.-H.1    Hellwege, A.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.