Electrostatic force microscopy studies of surface defects on GaAs/Ge films

Journal of Applied Physics

Volumn 85, Issue 5, 1999, Pages 2465-2472

  Xu, Q ^a   Hsu, J W P ^a  

^a University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000472116     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369622     Document Type: Article

References (35)

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