Kelvin probe force microscopy of molecular surfaces

Annual Review of Materials Science

Volumn 29, Issue , 1999, Pages 353-380

  Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; LANGMUIR BLODGETT FILMS; MOLECULAR ORIENTATION; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; PHASE SEPARATION; PHOTOCHEMICAL REACTIONS; PROBES; SCANNING TUNNELING MICROSCOPY; SURFACES;

CONTACT POTENTIAL DIFFERENCE; ELECTROSTATIC FORCE MICROSCOPE; FRICTION FORCE MICROSCOPY; KELVIN PROBE FORCE MICROSCOPY; MOLECULAR PHOTODIODES; MOLECULAR SURFACES; SCANNING MAXWELL STRESS ANISOTROPY; SCANNING SURFACE POTENTIAL MICROSCOPY;

MICROSCOPIC EXAMINATION;

EID: 6744222833     PISSN: 00846600     EISSN: None     Source Type: Book    
DOI: 10.1146/annurev.matsci.29.1.353     Document Type: Book

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