Electrostatic forces acting on the tip in atomic force microscopy: Modelization and comparison with analytic expressions

Journal of Applied Physics

Volumn 81, Issue 3, 1997, Pages 1023-1030

  Belaidi, S ^a   Girard, P ^a   Leveque, G ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000645519     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363884     Document Type: Article

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