Quantitative microwave near-field microscopy of dielectric properties

Review of Scientific Instruments

Volumn 69, Issue 11, 1998, Pages 3846-3851

  Gao, C ^a   Xiang, X D ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000116746     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149189     Document Type: Article

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