Nanometer-scale variations in interface potential by scanning probe microscopy

Journal of the American Ceramic Society

Volumn 82, Issue 7, 1999, Pages 1941-1944

  Huey, Bryan D ^a   Lisjak, Darja ^a,b   Bonnell, Dawn A ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC CONDUCTIVITY; GRAIN BOUNDARIES; IMAGING TECHNIQUES; INTERFACES (MATERIALS); NICKEL COMPOUNDS; POLYCRYSTALLINE MATERIALS; SURFACES; TEMPERATURE; VARISTORS; ZINC OXIDE;

MICROPATTERNING; NANOMETER SCALE VARIATIONS; POTENTIAL DISTRIBUTIONS; SCANNING PROBE MICROSCOPY; SCANNING SURFACE POTENTIAL MICROSCOPY;

ELECTRIC POTENTIAL;

EID: 0032633180     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1999.tb02023.x     Document Type: Article

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