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note
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Using x-ray finite-size effects, the thickness of the films was directly measured on all films thicker than ∼80 Å, thus checking the reliability of the rate calibration, typically, ± 10%. For the thinnest films we rely on the calibrated deposition rate.
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14
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85034185137
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note
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3 substrate, allowing us to confirm the epitaxy.
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17
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19
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0031339294
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The needed poling voltage is often much larger than the voltage corresponding to the coercive field of the material, an effect often attributed to a possible air gap between the tip and the sample surface. T. Hidaka, T. Maruyama, I. Sakai, M. Saitoh, L. A. Wills, R. Hiskes, S. A. Dicarolis, J. Amano, and C. M. Foster, Integr. Ferroelectr. 17, 319 (1997).
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