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Journal of Materials Research

Volumn 17, Issue 5, 2002, Pages 936-939

Contrast mechanism maps for piezoresponse force microscopy

(2) Kalinin, Sergei V a Bonnell, Dawn A a

a UNIVERSITY OF PENNSYLVANIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROSTATICS; FERROELECTRIC MATERIALS; FERROELECTRICITY; INDENTATION; STIFFNESS;

ELECTROMECHANICAL INTERACTIONS; FERROELECTRIC DOMAIN STRUCTURES; PIEZORESPONSE FORCE MICROSCOPY; TIP RADIUS OF CURVATURE; TIP-SURFACE JUNCTION;

MICROSCOPIC EXAMINATION;

EID: 0036565094 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2002.0138 Document Type: Article

Times cited : (41)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.